{"id":"https://openalex.org/W1521576271","doi":null,"title":"Visual surface inspection of scale-covered steel billets","display_name":"Visual surface inspection of scale-covered steel billets","publication_year":2008,"publication_date":"2008-02-06","ids":{"openalex":"https://openalex.org/W1521576271","mag":"1521576271"},"language":"en","primary_location":{"id":"mag:1521576271","doi":null,"is_oa":false,"landing_page_url":"https://dl.acm.org/citation.cfm?id=1722316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5031643443","display_name":"Jong Pil Yun","orcid":"https://orcid.org/0000-0002-2802-9978","observed_orcids":["https://orcid.org/0000-0002-2802-9978"]},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jong Pil Yun","raw_affiliation_strings":["Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#"],"raw_orcid":"https://orcid.org/0000-0002-2802-9978","affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021192943","display_name":"SungHoo Choi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SungHoo Choi","raw_affiliation_strings":["Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045224460","display_name":"Boyeul Seo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Boyeul Seo","raw_affiliation_strings":["Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100452155","display_name":"Sang Woo Kim","orcid":"https://orcid.org/0000-0001-6023-1837","observed_orcids":["https://orcid.org/0000-0001-6023-1837"]},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Woo Kim","raw_affiliation_strings":["Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#"],"raw_orcid":"https://orcid.org/0000-0001-6023-1837","affiliations":[{"raw_affiliation_string":"Pohang University of Science and Technology (POSTECH), Hyojadong, Namgu, Pohang, Korea#TAB#","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I123900574"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21069952,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"64","last_page":"69"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/steel-billets","display_name":"steel billets","score":0.7379999756813049},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.7459999918937683},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"visual inspection","score":0.8080000281333923},{"id":"https://openalex.org/keywords/gabor-filters","display_name":"Gabor filters","score":0.9760000109672546},{"id":"https://openalex.org/keywords/energy-separation","display_name":"energy separation","score":0.9190000295639038},{"id":"https://openalex.org/keywords/double-threshold-method","display_name":"double threshold method","score":0.8479999899864197},{"id":"https://openalex.org/keywords/laplacian","display_name":"Laplacian","score":0.8479999899864197},{"id":"https://openalex.org/keywords/image-enhancement","display_name":"image enhancement","score":0.4189999997615814}],"concepts":[{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.6631354689598083},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.6420202851295471},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.580167829990387},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5174189805984497},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4809498190879822},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4680010676383972},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.45947521924972534},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.452411413192749},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4438210129737854},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4169614911079407},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.347215861082077},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3352639079093933},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.3232858180999756},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17723426222801208},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10262230038642883},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07036003470420837},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:1521576271","doi":null,"is_oa":false,"landing_page_url":"https://dl.acm.org/citation.cfm?id=1722316","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W135548076","https://openalex.org/W1575677815","https://openalex.org/W1588043677","https://openalex.org/W1918724219","https://openalex.org/W2013460551","https://openalex.org/W2033819500","https://openalex.org/W2107986641","https://openalex.org/W2120694107","https://openalex.org/W2134447997","https://openalex.org/W2139963745","https://openalex.org/W2146384265","https://openalex.org/W2150511677","https://openalex.org/W2158010171","https://openalex.org/W4250878893"],"related_works":["https://openalex.org/W2007431582","https://openalex.org/W1998272384","https://openalex.org/W2085134744","https://openalex.org/W2039727588","https://openalex.org/W2130764526","https://openalex.org/W2605152262","https://openalex.org/W2022896648","https://openalex.org/W2052637396","https://openalex.org/W2618843429","https://openalex.org/W2781963849"],"abstract_inverted_index":{"In":[0],"this":[1,77],"paper":[2,78],"a":[3,19,80],"visual":[4],"surface":[5,16,36,67,115],"inspection":[6],"method":[7,102],"for":[8,83],"scalecovered":[9],"steel":[10,119],"billets":[11],"is":[12,24,37,46],"introduced.":[13],"The":[14],"billet":[15,35,114],"image":[17,61],"has":[18],"lot":[20],"of":[21,34,98],"scale,":[22],"which":[23],"oxidized":[25],"substance":[26],"unavoidably":[27],"caused":[28],"during":[29],"manufacturing":[30],"process.":[31],"Because":[32],"scale":[33,64],"similar":[38],"to":[39,48,63,70],"real":[40,118],"defects":[41,50],"such":[42],"as":[43],"crack,":[44],"it":[45],"difficult":[47],"distinguish":[49],"from":[51],"scale-covered":[52],"image.":[53],"Moreover,":[54],"different":[55],"reflection":[56],"properties":[57],"among":[58],"the":[59,66,96,109],"defect-free":[60],"due":[62],"on":[65,87,113],"make":[68],"hard":[69],"detect":[71],"defects.":[72],"To":[73,94],"solve":[74],"above":[75],"problems,":[76],"proposes":[79],"new":[81],"approach":[82],"defect":[84],"detection":[85],"based":[86],"Gabor":[88],"filters":[89],"with":[90],"optimized":[91],"energy":[92],"separation.":[93],"enhance":[95],"performance":[97],"detection,":[99],"double":[100],"threshold":[101],"and":[103],"Laplacian":[104],"operation":[105],"are":[106],"proposed.":[107],"Finally,":[108],"experimental":[110],"results":[111],"conducted":[112],"images":[116],"obtained":[117],"making":[120],"plant.":[121]},"counts_by_year":[],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}