{"id":"https://openalex.org/W1510052814","doi":"https://doi.org/10.1154/s0376030800003621","title":"Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel*","display_name":"Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel*","publication_year":1965,"publication_date":"1965-01-01","ids":{"openalex":"https://openalex.org/W1510052814","doi":"https://doi.org/10.1154/s0376030800003621","mag":"1510052814"},"language":"en","primary_location":{"id":"doi:10.1154/s0376030800003621","doi":"https://doi.org/10.1154/s0376030800003621","is_oa":false,"landing_page_url":"https://doi.org/10.1154/s0376030800003621","pdf_url":null,"source":{"id":"https://openalex.org/S2764582555","display_name":"Advances in X-ray Analysis","issn_l":"0376-0308","issn":["0376-0308","2631-3626"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4327874760","host_organization_name":"International Centre for Diffraction Data","host_organization_lineage":["https://openalex.org/P4327874760"],"host_organization_lineage_names":["International Centre for Diffraction Data"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in X-ray Analysis","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088419986","display_name":"Harvey Yakowitz","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Yakowitz","raw_affiliation_strings":["National Bureau of Standards, Washington, D.C","National Bureau of Standards"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Bureau of Standards, Washington, D.C","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Bureau of Standards","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013151489","display_name":"D.L. Vieth","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. L. Vieth","raw_affiliation_strings":["National Bureau of Standards, Washington, D.C","National Bureau of Standards"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Bureau of Standards, Washington, D.C","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Bureau of Standards","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109391284","display_name":"Kurt F. J. Heinrich","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. F. J. Heinrich","raw_affiliation_strings":["National Bureau of Standards, Washington, D.C","National Bureau of Standards"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Bureau of Standards, Washington, D.C","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Bureau of Standards","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067167234","display_name":"Robert E. Michaelis","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. E. Michaelis","raw_affiliation_strings":["National Bureau of Standards, Washington, D.C","National Bureau of Standards"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Bureau of Standards, Washington, D.C","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Bureau of Standards","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1321296531"],"apc_list":null,"apc_paid":null,"fwci":1.4198,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.79585007,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":null,"first_page":"289","last_page":"303"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.3495999872684479,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.3495999872684479,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.18320000171661377,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":0.12160000205039978,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/homogeneity","display_name":"homogeneity","score":0.628000020980835},{"id":"https://openalex.org/keywords/cartridge-brass","display_name":"cartridge brass","score":0.9409999847412109},{"id":"https://openalex.org/keywords/low-alloy-steel","display_name":"low-alloy steel","score":0.9660000205039978},{"id":"https://openalex.org/keywords/electron-probe-microanalysis","display_name":"electron probe microanalysis","score":0.8410000205039978},{"id":"https://openalex.org/keywords/calibration-standards","display_name":"calibration standards","score":0.7630000114440918},{"id":"https://openalex.org/keywords/elemental-distribution","display_name":"elemental distribution","score":0.6050000190734863},{"id":"https://openalex.org/keywords/optical-metallography","display_name":"optical metallography","score":0.7799999713897705}],"concepts":[{"id":"https://openalex.org/C2780033417","wikidata":"https://www.wikidata.org/wiki/Q39782","display_name":"Brass","level":3,"score":0.9028041362762451},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.655292272567749},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6068413853645325},{"id":"https://openalex.org/C2780026712","wikidata":"https://www.wikidata.org/wiki/Q37756","display_name":"Alloy","level":2,"score":0.6015983819961548},{"id":"https://openalex.org/C544778455","wikidata":"https://www.wikidata.org/wiki/Q753","display_name":"Copper","level":2,"score":0.5176318287849426},{"id":"https://openalex.org/C31033462","wikidata":"https://www.wikidata.org/wiki/Q3058182","display_name":"Microanalysis","level":2,"score":0.5060986876487732},{"id":"https://openalex.org/C2778478046","wikidata":"https://www.wikidata.org/wiki/Q34095","display_name":"Bronze","level":2,"score":0.5014822483062744},{"id":"https://openalex.org/C142259097","wikidata":"https://www.wikidata.org/wiki/Q5891314","display_name":"Homogeneity (statistics)","level":2,"score":0.46875691413879395},{"id":"https://openalex.org/C507968137","wikidata":"https://www.wikidata.org/wiki/Q1046","display_name":"Niobium","level":2,"score":0.46855077147483826},{"id":"https://openalex.org/C138411078","wikidata":"https://www.wikidata.org/wiki/Q911272","display_name":"Electron microprobe","level":2,"score":0.4655720889568329},{"id":"https://openalex.org/C535196362","wikidata":"https://www.wikidata.org/wiki/Q758","display_name":"Zinc","level":2,"score":0.464366614818573},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.45169445872306824},{"id":"https://openalex.org/C100859065","wikidata":"https://www.wikidata.org/wiki/Q906323","display_name":"Certified reference materials","level":3,"score":0.4123958945274353},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.23970896005630493},{"id":"https://openalex.org/C119128265","wikidata":"https://www.wikidata.org/wiki/Q900165","display_name":"Detection limit","level":2,"score":0.15187862515449524},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1154/s0376030800003621","doi":"https://doi.org/10.1154/s0376030800003621","is_oa":false,"landing_page_url":"https://doi.org/10.1154/s0376030800003621","pdf_url":null,"source":{"id":"https://openalex.org/S2764582555","display_name":"Advances in X-ray Analysis","issn_l":"0376-0308","issn":["0376-0308","2631-3626"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4327874760","host_organization_name":"International Centre for Diffraction Data","host_organization_lineage":["https://openalex.org/P4327874760"],"host_organization_lineage_names":["International Centre for Diffraction Data"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advances in X-ray Analysis","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W350962309","https://openalex.org/W2045559566","https://openalex.org/W2321741872","https://openalex.org/W3042040770"],"related_works":["https://openalex.org/W268383793","https://openalex.org/W2045559566","https://openalex.org/W2205370998","https://openalex.org/W1976655340","https://openalex.org/W2569715031","https://openalex.org/W2792623409","https://openalex.org/W2627023506","https://openalex.org/W281926616","https://openalex.org/W2052350148","https://openalex.org/W2477021050"],"abstract_inverted_index":{"Abstract":[0],"Most":[1],"modern":[2],"instrumental":[3],"methods":[4],"of":[5,11,14,38,49,79,83,128,253],"analysis":[6],"depend":[7],"on":[8],"the":[9,23,31,36,80,96,107,140,148,155,161,166,191,239,256],"use":[10,223],"known":[12],"standards":[13,91],"composition":[15],"for":[16,95,151,222,228,245],"calibration.":[17],"Newer":[18],"analytical":[19,72],"techniques,":[20,236],"such":[21,237],"as":[22,53,55,92,115,117,224,231,233,238],"solids":[24,240],"mass":[25,241],"spectrometer,":[26],"laser":[27],"probe":[28],"and,":[29],"especially,":[30],"electron-probe":[32,129,257],"microanalyzer":[33],"have":[34,67,123,247],"reduced":[35],"amount":[37],"a":[39,47,59,77,118,225,251],"sample":[40,104,121],"which":[41],"can":[42],"be":[43],"analyzed":[44],"quantitatively":[45],"to":[46,52,61,70,86,93],"range":[48],"about":[50],"0.1":[51],"small":[54],"0.00005":[56],"\u03bcg.":[57],"As":[58],"corollary":[60],"these":[62],"microanalytical":[63,98],"advances,":[64],"homogeneity":[65],"requirements":[66],"become":[68],"severe":[69],"meet":[71],"standards.":[73],"This":[74],"paper":[75],"describes":[76],"continuation":[78],"National":[81],"Bureau":[82],"Standards'":[84],"effort":[85],"characterize":[87],"more":[88],"fully":[89],"existing":[90],"suitability":[94],"new":[97],"techniques.":[99],"An":[100],"NBS":[101],"cartridge":[102],"brass":[103,162,219,246],"in":[105,139,147,154,160],"both":[106,215],"wrought":[108],"(NBS-1102)":[109],"and":[110,131,157,171,186,194,206,217],"chill":[111],"cast":[112],"forms":[113],"(NBS-C1102),":[114],"well":[116,232],"low-alloy":[119],"steel":[120,156],"(NBS-463),":[122],"been":[124,248],"investigated":[125],"by":[126,250],"means":[127],"micreanalysis":[130],"optical":[132],"metallography.":[133],"Some":[134],"17":[135],"elements":[136,144,153,159],"are":[137,145,163,188,196,208,220],"contained":[138],"brass,":[141,192],"while":[142,180,202],"25":[143],"found":[146],"steel.":[149],"Results":[150],"10":[152],"6":[158],"presented.":[164],"In":[165,190],"steel,":[167],"iron,":[168],"nickel,":[169],"copper,":[170],"silicon":[172,207],"ate":[173],"essentially":[174],"distributed":[175,197],"homogeneously":[176,198],"at":[177,199],"micron":[178,200],"levels,":[179],"manganese,":[181],"tantalum,":[182],"niobium,":[183],"zirconium,":[184],"sulfur,":[185,204],"chromium":[187],"not.":[189,209],"copper":[193],"zinc":[195],"levels":[201],"lead,":[203],"aluminum,":[205],"Electron-probe":[210],"micreanalyzer":[211],"results":[212,244],"indicate":[213],"that":[214],"NBS-1102":[216],"NBS-C1102":[218],"suitable":[221],"calibration":[226],"standard":[227],"electronprobe":[229],"microanalysis":[230],"other":[234],"microsnalyticat":[235],"spectrometer.":[242],"The":[243],"corroborated":[249],"number":[252],"laboratories":[254],"using":[255],"analyzer.":[258]},"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}