{"id":"https://openalex.org/W150460985","doi":null,"title":"Parametrical characterization of leakage power in embedded system caches using gated-VSS","display_name":"Parametrical characterization of leakage power in embedded system caches using gated-VSS","publication_year":2005,"publication_date":"2005-01-01","ids":{"openalex":"https://openalex.org/W150460985","mag":"150460985"},"language":"en","primary_location":{"id":"mag:150460985","doi":null,"is_oa":false,"landing_page_url":"https://dblp.uni-trier.de/db/conf/iastedCCS/iastedCCS2005.html#KudithipudiJ05","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067236813","display_name":"Dhireesha Kudithipudi","orcid":"https://orcid.org/0000-0003-4462-5224","observed_orcids":["https://orcid.org/0000-0003-4462-5224"]},"institutions":[{"id":"https://openalex.org/I45438204","display_name":"The University of Texas at San Antonio","ror":"https://ror.org/01kd65564","country_code":"US","type":"education","lineage":["https://openalex.org/I45438204"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dhireesha Kudithipudi","raw_affiliation_strings":["University of Texas at San Antonio"],"raw_orcid":"https://orcid.org/0000-0003-4462-5224","affiliations":[{"raw_affiliation_string":"University of Texas at San Antonio","institution_ids":["https://openalex.org/I45438204"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010151984","display_name":"Eugene B John","orcid":"https://orcid.org/0000-0001-9494-4894","observed_orcids":["https://orcid.org/0000-0001-9494-4894"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Eugene John","raw_affiliation_strings":["Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0001-9494-4894","affiliations":[{"raw_affiliation_string":"Electrical Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.0182885,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"308","last_page":"312"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.0017000000225380063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage-power","display_name":"leakage power","score":0.9940000176429749},{"id":"https://openalex.org/keywords/parametric-characterization","display_name":"parametric characterization","score":0.6600000262260437},{"id":"https://openalex.org/keywords/dynamic-voltage-and-frequency-scaling","display_name":"dynamic voltage and frequency scaling","score":0.6759999990463257}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7652232646942139},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6293398141860962},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5684012770652771},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5205098986625671},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49996256828308105},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41562438011169434},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.38906407356262207},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31425705552101135},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.17500954866409302},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16123676300048828},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11717575788497925},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.06685337424278259},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:150460985","doi":null,"is_oa":false,"landing_page_url":"https://dblp.uni-trier.de/db/conf/iastedCCS/iastedCCS2005.html#KudithipudiJ05","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2075127811","https://openalex.org/W7095239497","https://openalex.org/W3005044167","https://openalex.org/W2497617944","https://openalex.org/W2168925748","https://openalex.org/W2090444942","https://openalex.org/W2064746060","https://openalex.org/W2405465475","https://openalex.org/W2081286796","https://openalex.org/W833300446"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-09-22T06:50:58.402377","created_date":"2016-06-24T00:00:00"}