{"id":"https://openalex.org/W1504017627","doi":"https://doi.org/10.1016/j.snb.2007.06.001","title":"Influence of annealing on microstructure and NO2-sensing properties of sputtered WO3 thin films","display_name":"Influence of annealing on microstructure and NO2-sensing properties of sputtered WO3 thin films","publication_year":2007,"publication_date":"2007-06-14","ids":{"openalex":"https://openalex.org/W1504017627","doi":"https://doi.org/10.1016/j.snb.2007.06.001","mag":"1504017627"},"language":"en","primary_location":{"id":"doi:10.1016/j.snb.2007.06.001","doi":"https://doi.org/10.1016/j.snb.2007.06.001","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.snb.2007.06.001","pdf_url":null,"source":{"id":"https://openalex.org/S98455728","display_name":"Sensors and Actuators B Chemical","issn_l":"0925-4005","issn":["0925-4005","1873-3077"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators B: Chemical","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025980491","display_name":"Zhifu Liu","orcid":"https://orcid.org/0000-0001-9087-1114","observed_orcids":["https://orcid.org/0000-0001-9087-1114"]},"institutions":[{"id":"https://openalex.org/I42766147","display_name":"University of Toyama","ror":"https://ror.org/0445phv87","country_code":"JP","type":"education","lineage":["https://openalex.org/I42766147"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Zhifu Liu","raw_affiliation_strings":["School of Engineering, University of Toyama, Toyama 930-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Toyama, Toyama 930-8555, Japan","institution_ids":["https://openalex.org/I42766147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111774600","display_name":"Toshinai Yamazaki","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I42766147","display_name":"University of Toyama","ror":"https://ror.org/0445phv87","country_code":"JP","type":"education","lineage":["https://openalex.org/I42766147"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshinai Yamazaki","raw_affiliation_strings":["School of Engineering, University of Toyama, Toyama 930-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Toyama, Toyama 930-8555, Japan","institution_ids":["https://openalex.org/I42766147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079534532","display_name":"Yanbai Shen","orcid":"https://orcid.org/0000-0002-9855-3644","observed_orcids":["https://orcid.org/0000-0002-9855-3644"]},"institutions":[{"id":"https://openalex.org/I42766147","display_name":"University of Toyama","ror":"https://ror.org/0445phv87","country_code":"JP","type":"education","lineage":["https://openalex.org/I42766147"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yanbai Shen","raw_affiliation_strings":["School of Engineering, University of Toyama, Toyama 930-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Toyama, Toyama 930-8555, Japan","institution_ids":["https://openalex.org/I42766147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021096811","display_name":"Toshio Kikuta","orcid":"https://orcid.org/0000-0002-5014-1149","observed_orcids":["https://orcid.org/0000-0002-5014-1149"]},"institutions":[{"id":"https://openalex.org/I42766147","display_name":"University of Toyama","ror":"https://ror.org/0445phv87","country_code":"JP","type":"education","lineage":["https://openalex.org/I42766147"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshio Kikuta","raw_affiliation_strings":["School of Engineering, University of Toyama, Toyama 930-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Toyama, Toyama 930-8555, Japan","institution_ids":["https://openalex.org/I42766147"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044217219","display_name":"N. Nakatani","orcid":"https://orcid.org/0000-0002-0658-6706","observed_orcids":["https://orcid.org/0000-0002-0658-6706"]},"institutions":[{"id":"https://openalex.org/I42766147","display_name":"University of Toyama","ror":"https://ror.org/0445phv87","country_code":"JP","type":"education","lineage":["https://openalex.org/I42766147"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyuki Nakatani","raw_affiliation_strings":["School of Engineering, University of Toyama, Toyama 930-8555, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Toyama, Toyama 930-8555, Japan","institution_ids":["https://openalex.org/I42766147"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5025980491"],"corresponding_institution_ids":["https://openalex.org/I42766147"],"apc_list":{"value":5010,"currency":"USD","value_usd":5010},"apc_paid":null,"fwci":4.1619,"has_fulltext":false,"cited_by_count":100,"citation_normalized_percentile":{"value":0.93259539,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":87,"max":99},"biblio":{"volume":"128","issue":"1","first_page":"173","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10192","display_name":"Catalytic Processes in Materials Science","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wo3-thin-films","display_name":"WO3 thin films","score":0.8309999704360962},{"id":"https://openalex.org/keywords/annealing","display_name":"annealing","score":0.824999988079071},{"id":"https://openalex.org/keywords/no2-sensing","display_name":"NO2 gas sensing","score":0.9549999833106995},{"id":"https://openalex.org/keywords/sputtered-thin-films","display_name":"sputtered thin films","score":0.6890000104904175},{"id":"https://openalex.org/keywords/porous-structure","display_name":"porous structure","score":0.6039999723434448},{"id":"https://openalex.org/keywords/specific-surface-area","display_name":"specific surface area","score":0.722000002861023},{"id":"https://openalex.org/keywords/pore-volume","display_name":"pore volume","score":0.8349999785423279},{"id":"https://openalex.org/keywords/microstructure","display_name":"microstructure","score":0.699999988079071}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8464006185531616},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.8198004961013794},{"id":"https://openalex.org/C87976508","wikidata":"https://www.wikidata.org/wiki/Q1498213","display_name":"Microstructure","level":2,"score":0.786414623260498},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.7829698920249939},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6899200677871704},{"id":"https://openalex.org/C6648577","wikidata":"https://www.wikidata.org/wiki/Q622669","display_name":"Porosity","level":2,"score":0.5999903678894043},{"id":"https://openalex.org/C61276311","wikidata":"https://www.wikidata.org/wiki/Q624543","display_name":"Monoclinic crystal system","level":3,"score":0.5568792223930359},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.4172332286834717},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.4132586121559143},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4000544846057892},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.24590501189231873},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.19974285364151},{"id":"https://openalex.org/C115624301","wikidata":"https://www.wikidata.org/wiki/Q895901","display_name":"Crystal structure","level":2,"score":0.18243035674095154},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07278010249137878},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.054442375898361206},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.snb.2007.06.001","doi":"https://doi.org/10.1016/j.snb.2007.06.001","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.snb.2007.06.001","pdf_url":null,"source":{"id":"https://openalex.org/S98455728","display_name":"Sensors and Actuators B Chemical","issn_l":"0925-4005","issn":["0925-4005","1873-3077"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-a","jufo-1","ki-jl-1","norway-1","poland-200","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Sensors and Actuators B: Chemical","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320316431","display_name":"University of Toyama","ror":"https://ror.org/0445phv87"},{"id":"https://openalex.org/F4320323533","display_name":"Hokkaido University","ror":"https://ror.org/02e16g702"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1972307729","https://openalex.org/W1973002607","https://openalex.org/W1977009038","https://openalex.org/W1995261433","https://openalex.org/W1996131522","https://openalex.org/W2000834792","https://openalex.org/W2013318296","https://openalex.org/W2014445809","https://openalex.org/W2014549013","https://openalex.org/W2017050661","https://openalex.org/W2017840224","https://openalex.org/W2024001989","https://openalex.org/W2024004304","https://openalex.org/W2025961251","https://openalex.org/W2034406197","https://openalex.org/W2042705332","https://openalex.org/W2045069486","https://openalex.org/W2055840754","https://openalex.org/W2062814137","https://openalex.org/W2082799744","https://openalex.org/W2092401368","https://openalex.org/W2094297961","https://openalex.org/W2159650293","https://openalex.org/W2167775473","https://openalex.org/W2952583632"],"related_works":["https://openalex.org/W2372644669","https://openalex.org/W2200632723","https://openalex.org/W7133438688","https://openalex.org/W1499499087","https://openalex.org/W2017840224","https://openalex.org/W7216852189","https://openalex.org/W2013542737","https://openalex.org/W1995261433","https://openalex.org/W1995610080","https://openalex.org/W2013857177"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":8},{"year":2014,"cited_by_count":7},{"year":2013,"cited_by_count":13},{"year":2012,"cited_by_count":8}],"updated_date":"2026-10-16T09:59:22.235173","created_date":"2016-06-24T00:00:00"}