{"id":"https://openalex.org/W1494427490","doi":"https://doi.org/10.1109/ise.2005.1612403","title":"Environmentally Robust Electret Condenser Microphone","display_name":"Environmentally Robust Electret Condenser Microphone","publication_year":2006,"publication_date":"2006-04-06","ids":{"openalex":"https://openalex.org/W1494427490","doi":"https://doi.org/10.1109/ise.2005.1612403","mag":"1494427490"},"language":"en","primary_location":{"id":"doi:10.1109/ise.2005.1612403","doi":"https://doi.org/10.1109/ise.2005.1612403","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ise.2005.1612403","pdf_url":null,"source":{"id":"https://openalex.org/S4306420130","display_name":"International Symposium on Electrets","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 12th International Symposium on Electrets","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083002472","display_name":"Yasuhiro Riko","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y. Riko","raw_affiliation_strings":["Riko Associates, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Riko Associates, Yokohama, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111904598","display_name":"N. Funakoshi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405273792","display_name":"NTT Advanced Technology Corporation (Japan)","ror":"https://ror.org/00fmedr36","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405273792"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Funakoshi","raw_affiliation_strings":["NTT Advanced Technology Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NTT Advanced Technology Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4405273792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002431421","display_name":"Takeshi Shimizu","orcid":"https://orcid.org/0000-0003-3817-7154","observed_orcids":["https://orcid.org/0000-0003-3817-7154"]},"institutions":[{"id":"https://openalex.org/I4405273792","display_name":"NTT Advanced Technology Corporation (Japan)","ror":"https://ror.org/00fmedr36","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405273792"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Shimizu","raw_affiliation_strings":["NTT Advanced Technology Corporation, Tokyo, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NTT Advanced Technology Corporation, Tokyo, Japan","institution_ids":["https://openalex.org/I4405273792"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007056592","display_name":"Goro Yamauchi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I51803142","display_name":"Daido University","ror":"https://ror.org/02cntp233","country_code":"JP","type":"education","lineage":["https://openalex.org/I51803142"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"G. Yamauchi","raw_affiliation_strings":["Daido Institute of Technology, Nagoya, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Daido Institute of Technology, Nagoya, Japan","institution_ids":["https://openalex.org/I51803142"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021546883","display_name":"Yoshiaki Yasuno","orcid":"https://orcid.org/0000-0003-1645-7948","observed_orcids":["https://orcid.org/0000-0003-1645-7948"]},"institutions":[{"id":"https://openalex.org/I1283155146","display_name":"Panasonic (Japan)","ror":"https://ror.org/011tm7n37","country_code":"JP","type":"company","lineage":["https://openalex.org/I1283155146"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Yasuno","raw_affiliation_strings":["Panasonic SC Device Solutions Company Limited, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Panasonic SC Device Solutions Company Limited, Yokohama, Japan","institution_ids":["https://openalex.org/I1283155146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5275,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52009279,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"382","last_page":"385"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.8925999999046326,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.8925999999046326,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.012000000104308128,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","score":0.010099999606609344,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electret-condenser-microphone","display_name":"electret condenser microphone","score":0.9940000176429749},{"id":"https://openalex.org/keywords/water-repellent-coatings","display_name":"water-repellent coatings","score":0.8970000147819519},{"id":"https://openalex.org/keywords/water-resistance","display_name":"water resistance","score":0.34599998593330383},{"id":"https://openalex.org/keywords/alcohol-resistance","display_name":"alcohol resistance","score":0.9269999861717224},{"id":"https://openalex.org/keywords/electrostatic-shielding","display_name":"electrostatic shielding","score":0.7149999737739563},{"id":"https://openalex.org/keywords/coating-reliability","display_name":"coating reliability","score":0.6060000061988831},{"id":"https://openalex.org/keywords/accelerated-testing","display_name":"accelerated testing","score":0.6449999809265137},{"id":"https://openalex.org/keywords/environmental-robustness","display_name":"environmental robustness","score":0.6800000071525574}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.768527626991272},{"id":"https://openalex.org/C2781448156","wikidata":"https://www.wikidata.org/wiki/Q1570182","display_name":"Coating","level":2,"score":0.6032781004905701},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.5782602429389954},{"id":"https://openalex.org/C34455102","wikidata":"https://www.wikidata.org/wiki/Q1128459","display_name":"Electret","level":2,"score":0.5703818202018738},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.5174439549446106},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.4159352481365204},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3555828034877777},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33489739894866943},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ise.2005.1612403","doi":"https://doi.org/10.1109/ise.2005.1612403","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ise.2005.1612403","pdf_url":null,"source":{"id":"https://openalex.org/S4306420130","display_name":"International Symposium on Electrets","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2005 12th International Symposium on Electrets","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2010514644"],"related_works":["https://openalex.org/W2033368305","https://openalex.org/W2053363232","https://openalex.org/W2048844206","https://openalex.org/W1987013808","https://openalex.org/W2280303593","https://openalex.org/W4248708227","https://openalex.org/W4402747686","https://openalex.org/W2043510664","https://openalex.org/W2084332488","https://openalex.org/W2010514644"],"abstract_inverted_index":{"A":[0],"new":[1,76],"structure":[2,26,78],"of":[3,6,29,48,96,101,122,165],"front":[4],"filter":[5,57],"ECMs":[7],"has":[8,44,80,146],"been":[9],"introduced":[10],"to":[11,138],"protect":[12],"in":[13,115,119],"practical":[14],"use":[15],"from":[16],"such":[17,110],"common":[18],"hazards":[19],"as":[20,111],"water":[21,54,67,161],"or":[22],"alcohol.":[23],"This":[24,41],"protection":[25,77],"is":[27,70,157],"composed":[28],"acoustically":[30],"transparent":[31],"mesh":[32],"with":[33,88],"a":[34,45,163],"water-repellent":[35,42],"coating":[36,43,103],"on":[37,55],"an":[38,81],"electrically-conductive":[39],"layer.":[40],"contact":[46],"angle":[47],"more":[49],"than":[50,60],"150":[51],"degree":[52],"for":[53,72,150],"the":[56,89,94,102,120,139,148,151],"having":[58],"less":[59],"50":[61],"/spl":[62],"mu/m":[63],"aperture":[64],"which":[65,86,156],"chokes":[66],"invasion":[68],"but":[69],"enough":[71],"acoustical":[73],"transmission.":[74],"The":[75,99,141,168],"also":[79],"electrically":[82],"conductive":[83],"layer":[84],"inside":[85],"copes":[87],"induction":[90,169],"noise":[91,170],"problem":[92],"by":[93,106,173],"effect":[95],"electrostatic":[97],"shielding.":[98],"reliability":[100],"was":[104,171],"confirmed":[105],"several":[107],"accelerated":[108],"tests":[109,134],"long":[112],"term":[113],"immersion":[114],"water,":[116],"heat":[117,128],"cycling":[118],"presence":[121],"both":[123],"high":[124],"and":[125,130],"low":[126],"moisture,":[127],"shocks":[129],"surface":[131],"scratch.":[132],"These":[133],"showed":[135],"no":[136],"damage":[137],"coating.":[140],"fabricated":[142],"electret":[143],"condenser":[144],"microphone":[145],"met":[147],"requirements":[149],"IEC":[152],"60526":[153],"class":[154],"7":[155],"30":[158],"minutes":[159],"under":[160],"at":[162,177],"depth":[164],"1":[166],"meter.":[167],"reduced":[172],"approximately":[174],"10":[175],"dB":[176],"2":[178],"GHz.":[179]},"counts_by_year":[],"updated_date":"2026-10-05T09:50:58.205359","created_date":"2016-06-24T00:00:00"}