{"id":"https://openalex.org/W126697616","doi":null,"title":"Preliminary gas composition investigations at elevated temperatures and pressures using calibration-free tDLS with the residual amplitude modulation technique","display_name":"Preliminary gas composition investigations at elevated temperatures and pressures using calibration-free tDLS with the residual amplitude modulation technique","publication_year":2009,"publication_date":"2009-07-01","ids":{"openalex":"https://openalex.org/W126697616","mag":"126697616"},"language":"en","primary_location":{"id":"mag:126697616","doi":null,"is_oa":false,"landing_page_url":"https://strathprints.strath.ac.uk/14796/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058176824","display_name":"Michael Lengden","orcid":"https://orcid.org/0000-0002-9122-9462","observed_orcids":["https://orcid.org/0000-0002-9122-9462"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michael Lengden","raw_affiliation_strings":["Electronic And Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0002-9122-9462","affiliations":[{"raw_affiliation_string":"Electronic And Electrical Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001347443","display_name":"Walter Johnstone","orcid":"https://orcid.org/0000-0002-6376-9445","observed_orcids":["https://orcid.org/0000-0002-6376-9445"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Walter Johnstone","raw_affiliation_strings":["Electronic And Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0002-6376-9445","affiliations":[{"raw_affiliation_string":"Electronic And Electrical Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023708527","display_name":"James R. P. Bain","orcid":"https://orcid.org/0009-0004-4295-5005","observed_orcids":["https://orcid.org/0009-0004-4295-5005"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"James R. P. Bain","raw_affiliation_strings":["Electronic And Electrical Engineering"],"raw_orcid":"https://orcid.org/0009-0004-4295-5005","affiliations":[{"raw_affiliation_string":"Electronic And Electrical Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059832210","display_name":"George A. Stewart","orcid":"https://orcid.org/0000-0002-7922-6971","observed_orcids":["https://orcid.org/0000-0002-7922-6971"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"George Stewart","raw_affiliation_strings":["Electronic And Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0002-7922-6971","affiliations":[{"raw_affiliation_string":"Electronic And Electrical Engineering","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025678102","display_name":"Ian Armstrong","orcid":"https://orcid.org/0009-0003-1652-7990","observed_orcids":["https://orcid.org/0009-0003-1652-7990","https://orcid.org/0000-0002-2703-5014"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ian Armstrong","raw_affiliation_strings":["Electronic And Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0002-2703-5014","affiliations":[{"raw_affiliation_string":"Electronic And Electrical Engineering","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01006552,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11854","display_name":"Laser-induced spectroscopy and plasma","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gas-composition","display_name":"gas composition","score":0.6069999933242798},{"id":"https://openalex.org/keywords/high-temperature","display_name":"high temperature","score":0.6510000228881836},{"id":"https://openalex.org/keywords/high-pressure","display_name":"high pressure","score":0.9160000085830688},{"id":"https://openalex.org/keywords/residual-amplitude-modulation","display_name":"residual amplitude modulation","score":0.949999988079071},{"id":"https://openalex.org/keywords/tunable-diode-laser-spectroscopy","display_name":"tunable diode laser spectroscopy","score":0.6570000052452087}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7074921131134033},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.6851659417152405},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.6685405373573303},{"id":"https://openalex.org/C201905106","wikidata":"https://www.wikidata.org/wiki/Q183755","display_name":"Amplitude modulation","level":4,"score":0.6366836428642273},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6013569235801697},{"id":"https://openalex.org/C32891209","wikidata":"https://www.wikidata.org/wiki/Q483666","display_name":"Spectroscopy","level":2,"score":0.47069764137268066},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.46230000257492065},{"id":"https://openalex.org/C175721412","wikidata":"https://www.wikidata.org/wiki/Q5526327","display_name":"Gas composition","level":2,"score":0.4548024833202362},{"id":"https://openalex.org/C11930861","wikidata":"https://www.wikidata.org/wiki/Q181417","display_name":"Frequency modulation","level":3,"score":0.41216227412223816},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4110333025455475},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.4067489802837372},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3446517288684845},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.22783151268959045},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.1596938967704773},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.14065894484519958},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1387208104133606},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12936970591545105},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09198957681655884},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.08413109183311462},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.0839470624923706},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08097481727600098},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.06008294224739075},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:126697616","doi":null,"is_oa":false,"landing_page_url":"https://strathprints.strath.ac.uk/14796/","pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2136828616","https://openalex.org/W2088405767","https://openalex.org/W3201446916","https://openalex.org/W7003648071","https://openalex.org/W2158937372","https://openalex.org/W116600449","https://openalex.org/W2138767117","https://openalex.org/W1964532540","https://openalex.org/W598733222","https://openalex.org/W2162264741"],"abstract_inverted_index":{"This":[0],"paper":[1],"presented":[2],"at":[3,18],"the":[4,27],"7th":[5],"International":[6],"Conference":[7],"on":[8],"Tunable":[9],"Diode":[10],"Laser":[11],"Spectroscopy":[12],"examines":[13],"preliminary":[14],"gas":[15],"composition":[16],"investigations":[17],"elevated":[19],"temperatures":[20],"and":[21],"pressures":[22],"using":[23],"calibration-free":[24],"tDLS":[25],"with":[26],"residual":[28],"amplitude":[29],"modulation":[30],"technique.":[31]},"counts_by_year":[],"updated_date":"2026-11-09T13:22:03.289127","created_date":"2016-06-24T00:00:00"}