{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","description":"This cluster of papers focuses on the application of machine vision, texture analysis, and deep learning techniques for the automated detection and classification of fabric defects in industrial settings, particularly in semiconductor manufacturing. The research covers various methods such as Gabor filters, wafer map defect classification, and virtual metrology to enhance the accuracy and efficiency of fabric defect detection systems.","keywords":[{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.2083},{"id":"https://openalex.org/keywords/machine-vision","display_name":"machine vision","score":0.2693},{"id":"https://openalex.org/keywords/automated-visual-inspection","display_name":"automated visual inspection","score":0.7863},{"id":"https://openalex.org/keywords/surface-defect-detection","display_name":"surface defect detection","score":0.6976},{"id":"https://openalex.org/keywords/defect-classification","display_name":"defect classification","score":0.4261},{"id":"https://openalex.org/keywords/industrial-inspection","display_name":"industrial inspection","score":0.4835},{"id":"https://openalex.org/keywords/automated-inspection","display_name":"automated inspection","score":0.3902},{"id":"https://openalex.org/keywords/fabric-defect-detection","display_name":"fabric defect detection","score":0.9532},{"id":"https://openalex.org/keywords/manufacturing-quality-control","display_name":"manufacturing quality control","score":0.2237},{"id":"https://openalex.org/keywords/quality-inspection","display_name":"quality inspection","score":0.2074},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"automated optical inspection","score":0.7683},{"id":"https://openalex.org/keywords/automatic-defect-detection","display_name":"automated defect detection","score":0.4245},{"id":"https://openalex.org/keywords/industrial-defect-detection","display_name":"industrial defect detection","score":0.6877},{"id":"https://openalex.org/keywords/image-based-inspection","display_name":"image-based inspection","score":0.4482},{"id":"https://openalex.org/keywords/printed-circuit-board-inspection","display_name":"printed circuit board inspection","score":0.7211},{"id":"https://openalex.org/keywords/textile-inspection","display_name":"textile inspection","score":0.7233},{"id":"https://openalex.org/keywords/weld-defect-detection","display_name":"weld defect detection","score":0.314},{"id":"https://openalex.org/keywords/industrial-visual-inspection","display_name":"industrial visual inspection","score":0.736},{"id":"https://openalex.org/keywords/real-time-inspection","display_name":"real-time inspection","score":0.571},{"id":"https://openalex.org/keywords/steel-surface-defect-detection","display_name":"steel surface defect detection","score":0.9826},{"id":"https://openalex.org/keywords/defect-segmentation","display_name":"defect segmentation","score":0.6799},{"id":"https://openalex.org/keywords/surface-inspection","display_name":"surface inspection","score":0.3344},{"id":"https://openalex.org/keywords/real-time-defect-detection","display_name":"real-time defect detection","score":0.7041},{"id":"https://openalex.org/keywords/optical-inspection","display_name":"optical inspection","score":0.3794},{"id":"https://openalex.org/keywords/automated-quality-control","display_name":"automated quality control","score":0.2592}],"legacy_keywords":"Fabric Defect Detection; Machine Vision; Texture Analysis; Semiconductor Manufacturing; Deep Learning; Wafer Map Defect Classification; Gabor Filters; Automated Inspection; Surface Defect Detection; Virtual Metrology","ids":{"openalex":"https://openalex.org/T12111","wikipedia":"https://en.wikipedia.org/wiki/Computer_vision"},"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"},"siblings":[{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms"},{"id":"https://openalex.org/T10567","display_name":"Vehicle Routing Optimization Methods"},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry"},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization"},{"id":"https://openalex.org/T11223","display_name":"Maritime Ports and Logistics"},{"id":"https://openalex.org/T11568","display_name":"Railway Systems and Energy Efficiency"},{"id":"https://openalex.org/T11741","display_name":"Flexible and Reconfigurable Manufacturing Systems"},{"id":"https://openalex.org/T11814","display_name":"Advanced Manufacturing and Logistics Optimization"},{"id":"https://openalex.org/T12176","display_name":"Optimization and Packing Problems"},{"id":"https://openalex.org/T12746","display_name":"Sustainable Industrial Ecology"},{"id":"https://openalex.org/T12782","display_name":"Assembly Line Balancing Optimization"},{"id":"https://openalex.org/T12984","display_name":"Transport and Logistics Innovations"},{"id":"https://openalex.org/T13027","display_name":"Applied Advanced Technologies"},{"id":"https://openalex.org/T13113","display_name":"Engineering Technology and Methodologies"},{"id":"https://openalex.org/T13287","display_name":"Robotic Process Automation Applications"},{"id":"https://openalex.org/T13290","display_name":"Diverse Industrial Engineering Technologies"}],"works_count":77606,"cited_by_count":418394,"works_api_url":"https://api.openalex.org/works?filter=topics.id:T12111","updated_date":"2026-10-22T03:01:35","created_date":"2024-01-23T15:27:13"}