{"id":"https://openalex.org/keywords/vlsi-testing","display_name":"VLSI testing","description":"Methods for detecting defects and verifying the operation of very-large-scale integrated circuits during design, manufacture, and use.","display_name_alternatives":["very-large-scale integration testing","VLSI circuit testing","VLSI test","testing of VLSI circuits"],"ids":{"openalex":"https://openalex.org/keywords/vlsi-testing","wikidata":null},"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8454,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.8454,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"works_count":2691,"cited_by_count":21749,"works_api_url":"https://api.openalex.org/works?filter=keywords.id:keywords/vlsi-testing","updated_date":"2026-10-17T04:06:27","created_date":"2022-04-12T19:38:12"}