{"id":"https://openalex.org/keywords/tip-sample-distance-control","display_name":"tip-sample distance control","description":"Feedback methods for maintaining a desired separation between a scanning probe tip and a sample in near-field microscopy and related instruments.","display_name_alternatives":["tip\u2013sample separation control","tip-sample gap control","probe-sample distance control","tip-sample distance regulation"],"ids":{"openalex":"https://openalex.org/keywords/tip-sample-distance-control","wikidata":null},"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.3866,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.3866,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.3676,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"works_count":191,"cited_by_count":4712,"works_api_url":"https://api.openalex.org/works?filter=keywords.id:keywords/tip-sample-distance-control","updated_date":"2026-10-17T04:06:27","created_date":"2026-09-30T00:00:00"}