{"id":"https://openalex.org/keywords/scan-chain","display_name":"scan chain","description":"A serial arrangement of circuit elements in an integrated circuit that enables internal states to be shifted for testing and debugging.","display_name_alternatives":["scan chains"],"ids":{"openalex":"https://openalex.org/keywords/scan-chain","wikidata":"https://www.wikidata.org/wiki/Q225990"},"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.776,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.776,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.0765,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"works_count":1514,"cited_by_count":14654,"works_api_url":"https://api.openalex.org/works?filter=keywords.id:keywords/scan-chain","updated_date":"2026-10-17T04:06:27","created_date":"2022-04-12T19:38:12"}