{"id":"https://openalex.org/A5159962810","orcid":null,"observed_orcids":[],"display_name":"H. Rahaman","raw_author_names":["H. Rahaman","Rahaman, H."],"full_name":"H. Rahaman","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5159962810","orcid":null,"observed_orcids":[]},"affiliations":[],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":1,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","count":1,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":1.54e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":1e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":8.3e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.47380000352859497},{"id":"126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","score":0.3540000021457672},{"id":"100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","score":0.310699999332428},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2840000092983246},{"id":"128315158","wikidata":"https://www.wikidata.org/wiki/Q1063858","display_name":"Complex programmable logic device","score":0.2578999996185303}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":0}],"display_name_alternatives":["H. Rahaman","Rahaman, H."],"block_key":"h rahaman","works_api_url":"https://api.openalex.org/works?filter=author.id:A5159962810","updated_date":"2026-10-28T12:34:19","created_date":"2026-10-28T00:00:00"}