{"id":"https://openalex.org/A5159864153","orcid":null,"observed_orcids":[],"display_name":"Chen Mingming","raw_author_names":["Chen Mingming"],"full_name":"Chen Mingming","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5159864153","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4405280361","ror":"https://ror.org/02v5a5z29","display_name":"Xiamen Huaxia University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280361"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I4405280361","ror":"https://ror.org/02v5a5z29","display_name":"Xiamen Huaxia University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405280361"]}],"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":1,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":5.1e-06,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":4.9e-06,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.7e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.39910000562667847},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.33160001039505005},{"id":"104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","score":0.26019999384880066},{"id":"124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","score":0.2549000084400177},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.25119999051094055}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":0}],"display_name_alternatives":["Chen Mingming"],"block_key":"m chen","works_api_url":"https://api.openalex.org/works?filter=author.id:A5159864153","updated_date":"2026-11-04T11:47:51","created_date":"2026-10-28T00:00:00"}
