{"id":"https://openalex.org/A5159778116","orcid":null,"observed_orcids":[],"display_name":"E. Helel","raw_author_names":["E. Helel"],"full_name":"E. Helel","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5159778116","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I166928557","ror":"https://ror.org/00nhtcg76","display_name":"University of Monastir","country_code":"TN","type":"education","lineage":["https://openalex.org/I166928557"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I179097149","ror":"https://ror.org/057x6za15","display_name":"University of Carthage","country_code":"TN","type":"education","lineage":["https://openalex.org/I179097149"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I166928557","ror":"https://ror.org/00nhtcg76","display_name":"University of Monastir","country_code":"TN","type":"education","lineage":["https://openalex.org/I166928557"]},{"id":"https://openalex.org/I179097149","ror":"https://ror.org/057x6za15","display_name":"University of Carthage","country_code":"TN","type":"education","lineage":["https://openalex.org/I179097149"]}],"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","count":1,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":1,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":4.5e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":2e-06,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.5666000247001648},{"id":"119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","score":0.38440001010894775},{"id":"125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","score":0.36059999465942383},{"id":"102232406","wikidata":"https://www.wikidata.org/wiki/Q7783035","display_name":"Thermal conductivity measurement","score":0.2687000036239624},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.2651999890804291}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["E. Helel"],"block_key":"e helel","works_api_url":"https://api.openalex.org/works?filter=author.id:A5159778116","awards_count":0,"updated_date":"2026-10-28T12:34:19","created_date":"2026-10-28T00:00:00"}