{"id":"https://openalex.org/A5154960453","orcid":null,"observed_orcids":[],"display_name":"Ge Jin","raw_author_names":["Ge Jin"],"full_name":"Ge Jin","works_count":1,"cited_by_count":10,"summary_stats":{"2yr_mean_citedness":10.0,"h_index":1,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5154960453","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4405281421","ror":"https://ror.org/04an55a47","display_name":"Jiangsu Open University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405281421"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I4405281421","ror":"https://ror.org/04an55a47","display_name":"Jiangsu Open University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405281421"]}],"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","count":1,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","value":1.2e-05,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":3.4e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.6651999950408936},{"id":"109747225","wikidata":"https://www.wikidata.org/wiki/Q815758","display_name":"Scarcity","score":0.3898000121116638},{"id":"113644684","wikidata":"https://www.wikidata.org/wiki/Q1356717","display_name":"Statistical process control","score":0.30550000071525574},{"id":"111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","score":0.287200003862381},{"id":"114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","score":0.2572000026702881}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":10}],"display_name_alternatives":["Ge Jin"],"block_key":"g jin","works_api_url":"https://api.openalex.org/works?filter=author.id:A5154960453","updated_date":"2026-10-12T12:34:37","created_date":"2026-01-30T00:00:00"}