{"id":"https://openalex.org/A5152492902","orcid":null,"observed_orcids":[],"display_name":"Mohammad N. Bisheh","raw_author_names":["Bisheh, Mohammad N.","Mohammad N. Bisheh"],"full_name":"Mohammad N. Bisheh","works_count":2,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":0.5,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5152492902","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","count":1,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","value":2.44e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","value":1.23e-05,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":4e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6169000267982483},{"id":"739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","score":0.604200005531311},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5250999927520752},{"id":"124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","score":0.505299985408783},{"id":"101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","score":0.42660000920295715}],"counts_by_year":[{"year":2026,"works_count":2,"oa_works_count":2,"cited_by_count":1}],"display_name_alternatives":["Bisheh, Mohammad N.","Mohammad N. Bisheh"],"block_key":"m bisheh","works_api_url":"https://api.openalex.org/works?filter=author.id:A5152492902","updated_date":"2026-11-07T12:08:38","created_date":"2026-09-23T00:00:00"}