{"id":"https://openalex.org/A5148317172","orcid":"https://orcid.org/0009-0007-2000-4497","observed_orcids":["https://orcid.org/0009-0007-2000-4497"],"display_name":"Harber, Steven, C.","raw_author_names":["Harber, Steven C.","Harber, Steven, C."],"full_name":"Harber, Steven, C.","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5148317172","orcid":"https://orcid.org/0009-0007-2000-4497","observed_orcids":["https://orcid.org/0009-0007-2000-4497"]},"affiliations":[{"institution":{"id":"https://openalex.org/I82497590","ror":"https://ror.org/02v80fc35","display_name":"Auburn University","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I82497590","ror":"https://ror.org/02v80fc35","display_name":"Auburn University","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"topics":[{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11539","display_name":"Survey Methodology and Nonresponse","count":1,"subfield":{"id":"https://openalex.org/subfields/3312","display_name":"Sociology and Political Science"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10601","display_name":"Handwritten Text Recognition Techniques","value":7.8e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11539","display_name":"Survey Methodology and Nonresponse","value":7e-06,"subfield":{"id":"https://openalex.org/subfields/3312","display_name":"Sociology and Political Science"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.8e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"138944611","wikidata":"https://www.wikidata.org/wiki/Q1163287","display_name":"Clearance","score":0.5710999965667725},{"id":"141141315","wikidata":"https://www.wikidata.org/wiki/Q2379942","display_name":"Guard (computer science)","score":0.3813000023365021},{"id":"124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","score":0.29420000314712524},{"id":"133462117","wikidata":"https://www.wikidata.org/wiki/Q4929239","display_name":"Data collection","score":0.27239999175071716},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.27160000801086426}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":0}],"display_name_alternatives":["Harber, Steven C.","Harber, Steven, C."],"block_key":"s harber","works_api_url":"https://api.openalex.org/works?filter=author.id:A5148317172","updated_date":"2026-10-09T12:31:04","created_date":"2026-08-27T00:00:00"}