{"id":"https://openalex.org/A5147655853","orcid":"https://orcid.org/0009-0002-8001-5933","observed_orcids":["https://orcid.org/0009-0002-8001-5933"],"display_name":"Chentong Ye","raw_author_names":["Chentong Ye"],"full_name":"Chentong Ye","works_count":3,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":0.3333333333333333,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5147655853","orcid":"https://orcid.org/0009-0002-8001-5933","observed_orcids":["https://orcid.org/0009-0002-8001-5933"]},"affiliations":[{"institution":{"id":"https://openalex.org/I87445476","ror":"https://ror.org/017zhmm22","display_name":"Xi'an Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I87445476","ror":"https://ror.org/017zhmm22","display_name":"Xi'an Jiaotong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I87445476"]}],"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":1,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":2.01e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","value":9.9e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13171","display_name":"Polymer Science and PVC","value":9.9e-06,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":6.6e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7850000262260437},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.5067999958992004},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.392300009727478},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3353999853134155},{"id":"104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","score":0.2565999925136566}],"counts_by_year":[{"year":2026,"works_count":3,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["Chentong Ye"],"block_key":"c ye","works_api_url":"https://api.openalex.org/works?filter=author.id:A5147655853","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5147655853","updated_date":"2026-11-09T14:06:01","created_date":"2026-08-20T00:00:00"}