{"id":"https://openalex.org/A5147137205","orcid":"https://orcid.org/0000-0002-6080-4073","observed_orcids":["https://orcid.org/0000-0002-6080-4073"],"display_name":"Chao Xu","raw_author_names":["Chao Xu"],"full_name":"Chao Xu","works_count":1,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5147137205","orcid":"https://orcid.org/0000-0002-6080-4073","observed_orcids":["https://orcid.org/0000-0002-6080-4073"]},"affiliations":[],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":1,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":8.6e-06,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":3.4e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"145665481","wikidata":"https://www.wikidata.org/wiki/Q123339","display_name":"Honeycomb","score":0.6973999738693237},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.5461999773979187},{"id":"135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","score":0.2937000095844269},{"id":"104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","score":0.2784000039100647},{"id":"107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","score":0.2623000144958496}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":0}],"display_name_alternatives":["Chao Xu"],"block_key":"c xu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5147137205","awards_count":0,"updated_date":"2026-11-03T12:34:24","created_date":"2026-08-14T00:00:00"}