{"id":"https://openalex.org/A5124714435","orcid":null,"observed_orcids":[],"display_name":"Zhantao L","raw_author_names":["Zhantao L"],"full_name":"Zhantao L","works_count":1,"cited_by_count":1,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5124714435","orcid":null,"observed_orcids":[]},"affiliations":[],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","count":1,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","count":1,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12050","display_name":"Optical Polarization and Ellipsometry","value":1.12e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","value":3.4e-06,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.43540000915527344},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.3977999985218048},{"id":"106487976","wikidata":"https://www.wikidata.org/wiki/Q685816","display_name":"Matrix (chemical analysis)","score":0.3280999958515167},{"id":"118381688","wikidata":"https://www.wikidata.org/wiki/Q1079524","display_name":"Specular reflection","score":0.26570001244544983},{"id":"104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","score":0.25780001282691956}],"counts_by_year":[{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["Zhantao L"],"block_key":"l zhantao","works_api_url":"https://api.openalex.org/works?filter=author.id:A5124714435","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5124714435","updated_date":"2026-11-10T14:30:39","created_date":"2026-02-03T00:00:00"}