{"id":"https://openalex.org/A5122351349","orcid":"https://orcid.org/0000-0002-2385-7790","observed_orcids":["https://orcid.org/0000-0002-2385-7790"],"display_name":"Dr. Sheshang Degadwala","raw_author_names":["Degadwala, Dr. Sheshang","Degadwala, Sheshang","Dr. Sheshang Degadwala","Sheshang Degadwala"],"full_name":"Dr. Sheshang Degadwala","works_count":21,"cited_by_count":5,"summary_stats":{"2yr_mean_citedness":0.23809523809523808,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5122351349","orcid":"https://orcid.org/0000-0002-2385-7790","observed_orcids":["https://orcid.org/0000-0002-2385-7790"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4404532916","ror":"https://ror.org/05qfd6v89","display_name":"Sigma University","country_code":"IN","type":"education","lineage":["https://openalex.org/I4404532916"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I4404532916","ror":"https://ror.org/05qfd6v89","display_name":"Sigma University","country_code":"IN","type":"education","lineage":["https://openalex.org/I4404532916"]}],"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10616","display_name":"Smart Agriculture and AI","count":5,"subfield":{"id":"https://openalex.org/subfields/1110","display_name":"Plant Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":5,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10388","display_name":"Advanced Steganography and Watermarking Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10400","display_name":"Network Security and Intrusion Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12029","display_name":"DNA and Biological Computing","value":4.5e-05,"subfield":{"id":"https://openalex.org/subfields/2614","display_name":"Theoretical Computer Science"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12916","display_name":"COVID-19 impact on air quality","value":4e-05,"subfield":{"id":"https://openalex.org/subfields/2306","display_name":"Global and Planetary Change"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","value":3.47e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":2.32e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12946","display_name":"Fractal and DNA sequence analysis","value":2.12e-05,"subfield":{"id":"https://openalex.org/subfields/1312","display_name":"Molecular Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8213000297546387},{"id":"108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","score":0.7838000059127808},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7372999787330627},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.6729999780654907},{"id":"26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","score":0.5626999735832214}],"counts_by_year":[{"year":2026,"works_count":21,"oa_works_count":20,"cited_by_count":5}],"display_name_alternatives":["Degadwala, Dr. Sheshang","Degadwala, Sheshang","Dr. Sheshang Degadwala","Sheshang Degadwala"],"block_key":"s degadwala","works_api_url":"https://api.openalex.org/works?filter=author.id:A5122351349","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2026-01-09T00:00:00"}