{"id":"https://openalex.org/A5118516804","orcid":"https://orcid.org/0009-0006-8796-4807","observed_orcids":["https://orcid.org/0009-0006-8796-4807"],"display_name":"\u0418.\u0412. \u0427\u0443\u0444\u0430\u0440\u043e\u0432","raw_author_names":["I. V. Chufarov","\u0418.\u0412. \u0427\u0443\u0444\u0430\u0440\u043e\u0432","\u0427\u0443\u0444\u0430\u0440\u043e\u0432, \u0418\u0432\u0430\u043d \u0412\u0430\u043b\u0435\u0440\u044c\u0435\u0432\u0438\u0447"],"full_name":"\u0418.\u0412. \u0427\u0443\u0444\u0430\u0440\u043e\u0432","works_count":3,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5118516804","orcid":"https://orcid.org/0009-0006-8796-4807","observed_orcids":["https://orcid.org/0009-0006-8796-4807"]},"affiliations":[{"institution":{"id":"https://openalex.org/I90329211","ror":"https://ror.org/00ksn4909","display_name":"Ulyanovsk State Technical University","country_code":"RU","type":"education","lineage":["https://openalex.org/I90329211"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I90329211","ror":"https://ror.org/00ksn4909","display_name":"Ulyanovsk State Technical University","country_code":"RU","type":"education","lineage":["https://openalex.org/I90329211"]}],"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":3,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":2,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":1.39e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":1.01e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":9.7e-06,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","value":2.7e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8111000061035156},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6832000017166138},{"id":"50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","score":0.5497999787330627},{"id":"2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","score":0.3822999894618988},{"id":"17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","score":0.26429998874664307}],"counts_by_year":[{"year":2025,"works_count":3,"oa_works_count":1,"cited_by_count":0}],"display_name_alternatives":["I. V. Chufarov","\u0418.\u0412. \u0427\u0443\u0444\u0430\u0440\u043e\u0432","\u0427\u0443\u0444\u0430\u0440\u043e\u0432, \u0418\u0432\u0430\u043d \u0412\u0430\u043b\u0435\u0440\u044c\u0435\u0432\u0438\u0447"],"block_key":"i chufarov","works_api_url":"https://api.openalex.org/works?filter=author.id:A5118516804","awards_count":0,"updated_date":"2026-11-01T11:00:13","created_date":"2025-10-10T00:00:00"}