{"id":"https://openalex.org/A5117099125","orcid":"https://orcid.org/0009-0006-1116-6091","observed_orcids":["https://orcid.org/0009-0006-1116-6091"],"display_name":"Aiaal Eginov","raw_author_names":["A. A. Eginov","Aiaal A. Eginov","Aiaal Eginov","Eginov, Aiaal","Eginov, Aiaal Anatolevich"],"full_name":"Aiaal Eginov","works_count":9,"cited_by_count":8,"summary_stats":{"2yr_mean_citedness":0.8888888888888888,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5117099125","orcid":"https://orcid.org/0009-0006-1116-6091","observed_orcids":["https://orcid.org/0009-0006-1116-6091"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210154788","ror":"https://ror.org/053yx4c68","display_name":"Department of Industrial Technology","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210154788"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I4387155438","ror":"https://ror.org/00nqjr204","display_name":"Ministry of Science, Technology and Research","country_code":"LK","type":"government","lineage":["https://openalex.org/I4387155438"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I4405274976","ror":"https://ror.org/02qmgp631","display_name":"Toyota Technical Development Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405274976"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I4405275100","ror":"https://ror.org/02zfmfy54","display_name":"Toray Engineering Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405275100"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I4210154788","ror":"https://ror.org/053yx4c68","display_name":"Department of Industrial Technology","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210154788"]},{"id":"https://openalex.org/I4387155438","ror":"https://ror.org/00nqjr204","display_name":"Ministry of Science, Technology and Research","country_code":"LK","type":"government","lineage":["https://openalex.org/I4387155438"]},{"id":"https://openalex.org/I4405274976","ror":"https://ror.org/02qmgp631","display_name":"Toyota Technical Development Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405274976"]},{"id":"https://openalex.org/I4405275100","ror":"https://ror.org/02zfmfy54","display_name":"Toray Engineering Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405275100"]}],"topics":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":5,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":4,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12239","display_name":"Construction Management and Sustainability","count":2,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13263","display_name":"Building energy efficiency and sustainability","count":2,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14138","display_name":"Life Cycle Costing Analysis","value":2.68e-05,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":2.52e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":1.85e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12938","display_name":"Material Selection and Properties","value":1.68e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":1.46e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7591999769210815},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5584999918937683},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5170999765396118},{"id":"147176958","wikidata":"https://www.wikidata.org/wiki/Q77590","display_name":"Civil engineering","score":0.4244999885559082},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.4074000120162964}],"counts_by_year":[{"year":2025,"works_count":9,"oa_works_count":8,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":7}],"display_name_alternatives":["A. A. Eginov","Aiaal A. Eginov","Aiaal Eginov","Eginov, Aiaal","Eginov, Aiaal Anatolevich"],"block_key":"a eginov","works_api_url":"https://api.openalex.org/works?filter=author.id:A5117099125","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5117099125","updated_date":"2026-11-10T14:30:39","created_date":"2025-10-10T00:00:00"}