{"id":"https://openalex.org/A5115044970","orcid":"https://orcid.org/0000-0002-9845-4582","observed_orcids":["https://orcid.org/0000-0002-9845-4582"],"display_name":"Jianhua Zhang","raw_author_names":["Jian-Hua Zhang","Jianhua Zhang"],"full_name":"Jianhua Zhang","works_count":7,"cited_by_count":145,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5115044970","orcid":"https://orcid.org/0000-0002-9845-4582","observed_orcids":["https://orcid.org/0000-0002-9845-4582"]},"affiliations":[{"institution":{"id":"https://openalex.org/I113940042","ror":"https://ror.org/006teas31","display_name":"Shanghai University","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I154099455","ror":"https://ror.org/0207yh398","display_name":"Shandong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I30809798","ror":"https://ror.org/030bhh786","display_name":"ShanghaiTech University","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]},"years":[2024,2023,2022,2017]},{"institution":{"id":"https://openalex.org/I4391768157","ror":"https://ror.org/01jjraa45","display_name":"State Key Laboratory of Crystal Materials","country_code":"CN","type":"facility","lineage":["https://openalex.org/I154099455","https://openalex.org/I4391768157"]},"years":[2017]}],"last_known_institutions":[{"id":"https://openalex.org/I30809798","ror":"https://ror.org/030bhh786","display_name":"ShanghaiTech University","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":1,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":4.35e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10559","display_name":"Particle Accelerators and Free-Electron Lasers","value":1.59e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","value":1.34e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","value":8.7e-06,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":7.6e-06,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8274446725845337},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7835263609886169},{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.6634488105773926},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5556160807609558},{"id":"102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","score":0.0}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2022,"works_count":3,"oa_works_count":3,"cited_by_count":8},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":23},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":19},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":18}],"display_name_alternatives":["Jian-Hua Zhang","Jianhua Zhang"],"block_key":"j zhang","works_api_url":"https://api.openalex.org/works?filter=author.id:A5115044970","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}