{"id":"https://openalex.org/A5114819202","orcid":"https://orcid.org/0009-0008-0284-9151","observed_orcids":["https://orcid.org/0009-0008-0284-9151"],"display_name":"Min-Ho Yoon","raw_author_names":["Min-Ho Yoon","Min-ho Yoon"],"full_name":"Min-Ho Yoon","works_count":5,"cited_by_count":3,"summary_stats":{"2yr_mean_citedness":0.75,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5114819202","orcid":"https://orcid.org/0009-0008-0284-9151","observed_orcids":["https://orcid.org/0009-0008-0284-9151"]},"affiliations":[{"institution":{"id":"https://openalex.org/I141371507","ror":"https://ror.org/017xnm587","display_name":"Soongsil University","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]},"years":[2026,2025,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I141371507","ror":"https://ror.org/017xnm587","display_name":"Soongsil University","country_code":"KR","type":"education","lineage":["https://openalex.org/I141371507"]}],"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":5.02e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","value":3.11e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","value":1.45e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","value":1.42e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","value":5.1e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"83415579","wikidata":"https://www.wikidata.org/wiki/Q161973","display_name":"Arc (geometry)","score":0.7163000106811523},{"id":"143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","score":0.7006953954696655},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5066999793052673},{"id":"152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","score":0.5055999755859375},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.49470001459121704}],"counts_by_year":[{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2025,"works_count":2,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Min-Ho Yoon","Min-ho Yoon"],"block_key":"m yoon","works_api_url":"https://api.openalex.org/works?filter=author.id:A5114819202","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5114819202","updated_date":"2026-11-13T15:08:24","created_date":"2024-11-28T00:00:00"}