{"id":"https://openalex.org/A5114070815","orcid":"https://orcid.org/0009-0009-1776-9004","observed_orcids":["https://orcid.org/0009-0009-1776-9004"],"display_name":"Weiyi Cao","raw_author_names":["Wei-Yi Cao","Weiyi Cao"],"full_name":"Weiyi Cao","works_count":11,"cited_by_count":59,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5114070815","orcid":"https://orcid.org/0009-0009-1776-9004","observed_orcids":["https://orcid.org/0009-0009-1776-9004"]},"affiliations":[{"institution":{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I2802615301","ror":"https://ror.org/01z8tr155","display_name":"China Aerospace Science and Technology Corporation","country_code":"CN","type":"government","lineage":["https://openalex.org/I2802615301"]},"years":[2025,2022]},{"institution":{"id":"https://openalex.org/I4210089056","ror":"https://ror.org/007y7ej30","display_name":"Beijing Microelectronics Technology Institute","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]},"years":[2026,2025,2022,2021,2020,2019]},{"institution":{"id":"https://openalex.org/I82880672","ror":"https://ror.org/00wk2mp56","display_name":"Beihang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I4210089056","ror":"https://ror.org/007y7ej30","display_name":"Beijing Microelectronics Technology Institute","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210089056"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":6,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":9.52e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","value":4.58e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.25e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":2.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":1.61e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7408270835876465},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.6834803223609924},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4751396179199219},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.35466963052749634},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.33141952753067017}],"counts_by_year":[{"year":2019,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2020,"works_count":4,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":13},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":12},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":5}],"display_name_alternatives":["Wei-Yi Cao","Weiyi Cao"],"block_key":"w cao","works_api_url":"https://api.openalex.org/works?filter=author.id:A5114070815","awards_count":0,"updated_date":"2026-11-08T12:57:04","created_date":"2020-02-07T00:00:00"}