{"id":"https://openalex.org/A5113983174","orcid":null,"observed_orcids":[],"display_name":"Thomas M. Hall","raw_author_names":["Hall, Thomas M.","T M Hall","T. M. Hall","T.M. Hall","Thomas M. Hall"],"full_name":"Thomas M. Hall","works_count":16,"cited_by_count":625,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":12,"i10_index":12},"ids":{"openalex":"https://openalex.org/A5113983174","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1283103587","ror":"https://ror.org/02bbd5539","display_name":"AT&T (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1283103587"]},"years":[1982,1979]},{"institution":{"id":"https://openalex.org/I200870766","ror":"https://ror.org/02ex6cf31","display_name":"Brookhaven National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I200870766","https://openalex.org/I39565521","https://openalex.org/I4210142672"]},"years":[1975,1974,1973,1972]},{"institution":{"id":"https://openalex.org/I205783295","ror":"https://ror.org/05bnh6r87","display_name":"Cornell University","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]},"years":[1978,1977,1976,1975]},{"institution":{"id":"https://openalex.org/I59553526","ror":"https://ror.org/05qghxh33","display_name":"Stony Brook University","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]},"years":[1975,1974]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":8,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10592","display_name":"Fusion materials and technologies","count":6,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","count":6,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","value":0.0001144,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":7.82e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":1.85e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10683","display_name":"Mass Spectrometry Techniques and Applications","value":1.42e-05,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13645","display_name":"Thermodynamic and Structural Properties of Metals and Alloys","value":1.38e-05,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.8652023673057556},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7680968046188354},{"id":"145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","score":0.7318204641342163},{"id":"184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","score":0.6569058895111084},{"id":"185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","score":0.48232409358024597}],"counts_by_year":[{"year":1972,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1974,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1975,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1978,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1979,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Hall, Thomas M.","T M Hall","T. M. Hall","T.M. Hall","Thomas M. Hall"],"block_key":"t hall","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113983174","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5113983174","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}