{"id":"https://openalex.org/A5113922186","orcid":null,"observed_orcids":[],"display_name":"Rensheng Zhou","raw_author_names":["Rensheng R. Zhou","Rensheng Zhou"],"full_name":"Rensheng R. Zhou","works_count":5,"cited_by_count":157,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5113922186","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},"years":[2014,2013,2012]}],"last_known_institutions":[{"id":"https://openalex.org/I130701444","ror":"https://ror.org/01zkghx44","display_name":"Georgia Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":5,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":5,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","count":1,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":1.73e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":1.62e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","value":1.35e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11871","display_name":"Advanced Statistical Methods and Models","value":5.9e-06,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","score":0.9024938344955444},{"id":"155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","score":0.781157374382019},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.685016393661499},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.3890509009361267},{"id":"76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","score":0.10265350341796875}],"counts_by_year":[{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":9},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":5}],"display_name_alternatives":["Rensheng R. Zhou","Rensheng Zhou"],"block_key":"r zhou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113922186","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}