{"id":"https://openalex.org/A5113689695","orcid":"https://orcid.org/0000-0002-8063-573X","observed_orcids":["https://orcid.org/0000-0002-8063-573X"],"display_name":"Yong Shu","raw_author_names":["Shu Yong","Y. Shu","Yong Shu"],"full_name":"Yong Shu","works_count":18,"cited_by_count":147,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5113689695","orcid":"https://orcid.org/0000-0002-8063-573X","observed_orcids":["https://orcid.org/0000-0002-8063-573X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I170215575","ror":"https://ror.org/05d2yfz11","display_name":"National University of Defense Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]},"years":[2014,2013,2012,2010]},{"institution":{"id":"https://openalex.org/I4210104252","ror":"https://ror.org/00seraz22","display_name":"Air Force Engineering University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]},"years":[2021,2020,2019,2018]}],"last_known_institutions":[{"id":"https://openalex.org/I4210104252","ror":"https://ror.org/00seraz22","display_name":"Air Force Engineering University","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210104252"]}],"topics":[{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":14,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","count":4,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":4,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":0.0001211,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","value":0.0001101,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","value":2.11e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","value":1.83e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":1.69e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8883839249610901},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.854318380355835},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.647793173789978},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6460860967636108},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.5268301367759705}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2013,"works_count":5,"oa_works_count":4,"cited_by_count":1},{"year":2014,"works_count":2,"oa_works_count":0,"cited_by_count":12},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":8},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":10},{"year":2020,"works_count":4,"oa_works_count":0,"cited_by_count":14},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":17}],"display_name_alternatives":["Shu Yong","Y. Shu","Yong Shu"],"block_key":"y shu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113689695","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}