{"id":"https://openalex.org/A5113587058","orcid":null,"observed_orcids":[],"display_name":"Th. H. de Keijser","raw_author_names":["Keijser, T. H. de","Keijser, TH  de","T H de Keijser","T. H. de Keijser","T.H. de Keijser","TH de Keijser","Th H de Keijser","Th. H. De Keijser","Th. H. Keijser","Th. H. de Keijser","Th. de Keijser","Th.H de Keijser","Th.H. de Keijser","Th.T. de Keijser","ThH de Keijser"],"full_name":"Th. H. De Keijser","works_count":95,"cited_by_count":4466,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":27,"i10_index":47},"ids":{"openalex":"https://openalex.org/A5113587058","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I169381384","ror":"https://ror.org/012p63287","display_name":"University of Groningen","country_code":"NL","type":"education","lineage":["https://openalex.org/I169381384"]},"years":[1991,1981]},{"institution":{"id":"https://openalex.org/I4210093035","ror":"https://ror.org/00fyemf28","display_name":"Materials innovation institute","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210093035"]},"years":[2008,1996,1994,1993,1991]},{"institution":{"id":"https://openalex.org/I98358874","ror":"https://ror.org/02e2c7k09","display_name":"Delft University of Technology","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]},"years":[2000,1998,1997,1996,1995,1993,1992,1991,1990,1989,1988,1987,1986,1985,1984,1983,1982,1981,1980,1978,1977,1975]}],"last_known_institutions":[{"id":"https://openalex.org/I4210093035","ror":"https://ror.org/00fyemf28","display_name":"Materials innovation institute","country_code":"NL","type":"facility","lineage":["https://openalex.org/I4210093035"]}],"topics":[{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","count":39,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":24,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10204","display_name":"Microstructure and mechanical properties","count":19,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","count":19,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10670","display_name":"Aluminum Alloy Microstructure Properties","count":19,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11887","display_name":"Quasicrystal Structures and Properties","value":0.0002484,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","value":0.0001767,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10670","display_name":"Aluminum Alloy Microstructure Properties","value":0.0001026,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","value":8.91e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","value":8e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9365271925926208},{"id":"207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","score":0.8537521958351135},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7246090769767761},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6159890294075012},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.3844035863876343}],"counts_by_year":[{"year":1975,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":1978,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":1980,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":1982,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":1983,"works_count":5,"oa_works_count":3,"cited_by_count":0},{"year":1984,"works_count":5,"oa_works_count":3,"cited_by_count":0},{"year":1985,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":7,"oa_works_count":2,"cited_by_count":0},{"year":1987,"works_count":6,"oa_works_count":2,"cited_by_count":0},{"year":1988,"works_count":6,"oa_works_count":3,"cited_by_count":0},{"year":1989,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1990,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":6,"oa_works_count":3,"cited_by_count":0},{"year":1992,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":141},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":175},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":178},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":138},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":134},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":132},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":161},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":141},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":180},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":162},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":144},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":116},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":134},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":102},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":91}],"display_name_alternatives":["Keijser, T. H. de","Keijser, TH  de","T H de Keijser","T. H. de Keijser","T.H. de Keijser","TH de Keijser","Th H de Keijser","Th. H. De Keijser","Th. H. Keijser","Th. H. de Keijser","Th. de Keijser","Th.H de Keijser","Th.H. de Keijser","Th.T. de Keijser","ThH de Keijser"],"block_key":"t keijser","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113587058","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}