{"id":"https://openalex.org/A5113583548","orcid":null,"observed_orcids":[],"display_name":"Masashi Ueno","raw_author_names":["M. Ueno","Masashi UENO","Masashi Ueno"],"full_name":"Masashi UENO","works_count":22,"cited_by_count":317,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5113583548","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I146094533","ror":"https://ror.org/01jce8981","display_name":"Mitsubishi Corporation (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I146094533","https://openalex.org/I4210101380"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I2799635668","ror":"https://ror.org/056701b75","display_name":"Fuji Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2799635668"]},"years":[1983]},{"institution":{"id":"https://openalex.org/I2800865746","ror":"https://ror.org/059yhyy33","display_name":"Japan Aerospace Exploration Agency","country_code":"JP","type":"facility","lineage":["https://openalex.org/I2800865746"]},"years":[2012,2011]},{"institution":{"id":"https://openalex.org/I4210101380","ror":"https://ror.org/014m1ef46","display_name":"Mitsubishi Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210101380"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I4210133125","ror":"https://ror.org/033y26782","display_name":"Mitsubishi Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]},"years":[2020,2014,2013,2012,2011,2009,2006,2005,2004,2003,2001,2000,1999,1996,1995]}],"last_known_institutions":[{"id":"https://openalex.org/I4210133125","ror":"https://ror.org/033y26782","display_name":"Mitsubishi Electric (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":16,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","count":15,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":0.0002924,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":0.0001269,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":7.13e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12442","display_name":"Thermal Radiation and Cooling Technologies","value":3.03e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","value":1.35e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8849704265594482},{"id":"158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","score":0.8242007493972778},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7751818895339966},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7096909284591675},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5528601408004761}],"counts_by_year":[{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":1,"oa_works_count":1,"cited_by_count":26},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":25},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":13}],"display_name_alternatives":["M. Ueno","Masashi UENO","Masashi Ueno"],"block_key":"m ueno","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113583548","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}
