{"id":"https://openalex.org/A5113082177","orcid":"https://orcid.org/0000-0001-6138-8991","observed_orcids":["https://orcid.org/0000-0001-6138-8991"],"display_name":"\u041e\u043a\u0441\u0430\u043d\u0430 \u041e\u043b\u0435\u043a\u0441\u0430\u043d\u0434\u0440\u0456\u0432\u043d\u0430 \u041b\u0443\u0433\u043e\u0432\u0438\u0445","raw_author_names":["O.O. Luhovykh","O.O. \u041b\u0443\u0433\u043e\u0432\u0438\u0445","Oksana Lugovyh","Oksana Luhovykh","Oksana Shapovalova","\u041b\u0443\u0433\u043e\u0432\u0438\u0445, \u041e. \u041e.","\u041e.\u041e. \u041b\u0443\u0433\u043e\u0432\u0438\u0445","\u041e\u043a\u0441\u0430\u043d\u0430 \u041e\u043b\u0435\u043a\u0441\u0430\u043d\u0434\u0440\u0456\u0432\u043d\u0430 \u041b\u0443\u0433\u043e\u0432\u0438\u0445"],"full_name":"\u041b\u0443\u0433\u043e\u0432\u0438\u0445, \u041e\u043a\u0441\u0430\u043d\u0430 \u041e\u043b\u0435\u043a\u0441\u0430\u043d\u0434\u0440\u0456\u0432\u043d\u0430","works_count":17,"cited_by_count":58,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5113082177","orcid":"https://orcid.org/0000-0001-6138-8991","observed_orcids":["https://orcid.org/0000-0001-6138-8991"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210149696","ror":"https://ror.org/04r5xzk86","display_name":"Zhytomyr Polytechnic State University","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210149696"]},"years":[2025,2023,2022,2021,2020,2018,2017,2015]}],"last_known_institutions":[{"id":"https://openalex.org/I4210149696","ror":"https://ror.org/04r5xzk86","display_name":"Zhytomyr Polytechnic State University","country_code":"UA","type":"education","lineage":["https://openalex.org/I4210149696"]}],"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":6,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10331","display_name":"Video Surveillance and Tracking Methods","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13579","display_name":"Image and Video Stabilization","value":5.78e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":4.84e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14042","display_name":"Technology and Security Systems","value":3.92e-05,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":2.77e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":2.73e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.7858777046203613},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6988973021507263},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6686387658119202},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.48401114344596863},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.2736862599849701}],"counts_by_year":[{"year":2015,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2018,"works_count":3,"oa_works_count":1,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2023,"works_count":3,"oa_works_count":3,"cited_by_count":5},{"year":2024,"works_count":2,"oa_works_count":2,"cited_by_count":4},{"year":2025,"works_count":3,"oa_works_count":2,"cited_by_count":10},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":5}],"display_name_alternatives":["O.O. Luhovykh","O.O. \u041b\u0443\u0433\u043e\u0432\u0438\u0445","Oksana Lugovyh","Oksana Luhovykh","Oksana Shapovalova","\u041b\u0443\u0433\u043e\u0432\u0438\u0445, \u041e. \u041e.","\u041e.\u041e. \u041b\u0443\u0433\u043e\u0432\u0438\u0445","\u041e\u043a\u0441\u0430\u043d\u0430 \u041e\u043b\u0435\u043a\u0441\u0430\u043d\u0434\u0440\u0456\u0432\u043d\u0430 \u041b\u0443\u0433\u043e\u0432\u0438\u0445"],"block_key":"o luhovykh","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113082177","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5113082177","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}