{"id":"https://openalex.org/A5113030432","orcid":null,"observed_orcids":[],"display_name":"Ryu Miyahara","raw_author_names":["Ryu MIYAHARA","Ryu Miyahara"],"full_name":"Ryu MIYAHARA","works_count":3,"cited_by_count":6,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5113030432","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210086624","ror":"https://ror.org/002k06d85","display_name":"National Institute of Technology, Tokyo College","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210086624","https://openalex.org/I4210120810"]},"years":[2024,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I4210086624","ror":"https://ror.org/002k06d85","display_name":"National Institute of Technology, Tokyo College","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210086624","https://openalex.org/I4210120810"]}],"topics":[{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10653","display_name":"Robot Manipulation and Learning","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10888","display_name":"Augmented Reality Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":1,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13270","display_name":"QR Code Applications and Technologies","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10888","display_name":"Augmented Reality Applications","value":1.31e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10653","display_name":"Robot Manipulation and Learning","value":1.16e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","value":1.1e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7248305082321167},{"id":"198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","score":0.6967064738273621},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6818647384643555},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5790150165557861},{"id":"10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","score":0.0}],"counts_by_year":[{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Ryu MIYAHARA","Ryu Miyahara"],"block_key":"r miyahara","works_api_url":"https://api.openalex.org/works?filter=author.id:A5113030432","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2023-10-25T00:00:00"}