{"id":"https://openalex.org/A5112856494","orcid":null,"observed_orcids":[],"display_name":"Chuck Hawkins","raw_author_names":["Chuck Hawkins"],"full_name":"Chuck Hawkins","works_count":14,"cited_by_count":45,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5112856494","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I169521973","ror":"https://ror.org/05fs6jp91","display_name":"University of New Mexico","country_code":"US","type":"education","lineage":["https://openalex.org/I169521973"]},"years":[2012,2010,2009,2006,2005,2002]},{"institution":{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I39824353","ror":"https://ror.org/00bpmmc63","display_name":"National Institute of Astrophysics, Optics and Electronics","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]},"years":[2010,2009]},{"institution":{"id":"https://openalex.org/I50441567","ror":"https://ror.org/03e10x626","display_name":"Universitat de les Illes Balears","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]},"years":[2012]}],"last_known_institutions":[{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":9,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13681","display_name":"Engineering and Information Technology","count":4,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10317","display_name":"Advanced Database Systems and Queries","count":3,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0001131,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":9.38e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":3.46e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11106","display_name":"Data Management and Algorithms","value":2.52e-05,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":1.97e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.732655942440033},{"id":"200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","score":0.5870000123977661},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.496343195438385},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4681698679924011},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.42010000348091125}],"counts_by_year":[{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Chuck Hawkins"],"block_key":"c hawkins","works_api_url":"https://api.openalex.org/works?filter=author.id:A5112856494","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5112856494","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}