{"id":"https://openalex.org/A5111958773","orcid":null,"observed_orcids":[],"display_name":"Kan Nakayama","raw_author_names":["Kan NAKAYAMA","Kan Nakayama","Kan Nakayama Kan Nakayama"],"full_name":"Kan Nakayama Kan Nakayama","works_count":40,"cited_by_count":370,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5111958773","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4405273829","ror":"https://ror.org/00j3eeb74","display_name":"National Metrology Institute of Japan","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},"years":[2007,2000,1997,1996,1995]},{"institution":{"id":"https://openalex.org/I73613424","ror":"https://ror.org/01703db54","display_name":"National Institute of Advanced Industrial Science and Technology","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]},"years":[2007,2003,2001]},{"institution":{"id":"https://openalex.org/I74801974","ror":"https://ror.org/057zh3y96","display_name":"The University of Tokyo","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},"years":[1973,1971,1970]}],"last_known_institutions":[{"id":"https://openalex.org/I4405273829","ror":"https://ror.org/00j3eeb74","display_name":"National Metrology Institute of Japan","country_code":"JP","type":"government","lineage":["https://openalex.org/I4405273829","https://openalex.org/I73613424"]},{"id":"https://openalex.org/I73613424","ror":"https://ror.org/01703db54","display_name":"National Institute of Advanced Industrial Science and Technology","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":22,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","count":16,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","count":14,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":10,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.0001214,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","value":0.0001113,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12613","display_name":"X-ray Diffraction in Crystallography","value":7.26e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":4.53e-05,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13257","display_name":"Advanced Control and Stabilization in Aerospace Systems","value":4.27e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","score":0.884228527545929},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8558196425437927},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7386876344680786},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7010473012924194},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6534383893013}],"counts_by_year":[{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1975,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1978,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":1979,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1990,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1998,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["Kan NAKAYAMA","Kan Nakayama","Kan Nakayama Kan Nakayama"],"block_key":"k nakayama","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111958773","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}