{"id":"https://openalex.org/A5111931685","orcid":null,"observed_orcids":[],"display_name":"C. Di","raw_author_names":["C. Di","Di, C","Di, C Chennian"],"full_name":"Di, C Chennian","works_count":12,"cited_by_count":237,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5111931685","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1341412227","ror":"https://ror.org/05hh8d621","display_name":"IBM (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},"years":[1996]},{"institution":{"id":"https://openalex.org/I83019370","ror":"https://ror.org/02c2kyt77","display_name":"Eindhoven University of Technology","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]},"years":[2002,1996,1992]}],"last_known_institutions":[{"id":"https://openalex.org/I83019370","ror":"https://ror.org/02c2kyt77","display_name":"Eindhoven University of Technology","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":12,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0001275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":0.0001253,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":8.65e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","value":1.51e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","value":4.5e-06,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6996463537216187},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.4688013195991516},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.38196492195129395},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.3806843161582947},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.26328906416893005}],"counts_by_year":[{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":6,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["C. Di","Di, C","Di, C Chennian"],"block_key":"c di","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111931685","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}