{"id":"https://openalex.org/A5111928550","orcid":null,"observed_orcids":[],"display_name":"Maddumage Karunaratne","raw_author_names":["MADDUMAGE KARUNARATNE","Maddumage Karunaratne","Maddumage Karunaratne1 And Bejoy G. Oomman2"],"full_name":"Karunaratne, Maddumage","works_count":18,"cited_by_count":16,"summary_stats":{"2yr_mean_citedness":0.2,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5111928550","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I110383171","ror":"https://ror.org/03ac64295","display_name":"American Society For Engineering Education","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I110383171"]},"years":[2020,2018]},{"institution":{"id":"https://openalex.org/I170201317","ror":"https://ror.org/01an3r305","display_name":"University of Pittsburgh","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317"]},"years":[2023,2020,2019,2018,2016,2009,2008]},{"institution":{"id":"https://openalex.org/I195740183","ror":"https://ror.org/0491f5305","display_name":"University of Moratuwa","country_code":"LK","type":"education","lineage":["https://openalex.org/I195740183"]},"years":[2020,2018]},{"institution":{"id":"https://openalex.org/I368840534","ror":"https://ror.org/02teq1165","display_name":"University of Mississippi","country_code":"US","type":"education","lineage":["https://openalex.org/I368840534","https://openalex.org/I4210141039"]},"years":[2020,2018]},{"institution":{"id":"https://openalex.org/I4210134124","ror":"https://ror.org/03n9scz70","display_name":"University of Pittsburgh at Johnstown","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317","https://openalex.org/I4210134124"]},"years":[2026,2024,2023,2020,2018,2016,2008]},{"institution":{"id":"https://openalex.org/I97018004","ror":"https://ror.org/00f54p054","display_name":"Stanford University","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]},"years":[2020]}],"last_known_institutions":[{"id":"https://openalex.org/I4210134124","ror":"https://ror.org/03n9scz70","display_name":"University of Pittsburgh at Johnstown","country_code":"US","type":"education","lineage":["https://openalex.org/I170201317","https://openalex.org/I4210134124"]}],"topics":[{"id":"https://openalex.org/T13682","display_name":"Engineering Education and Pedagogy","count":13,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12124","display_name":"Engineering Education and Curriculum Development","count":7,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11299","display_name":"Problem and Project Based Learning","count":5,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":4,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","count":4,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13827","display_name":"Mechatronics Education and Applications","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":4.18e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13682","display_name":"Engineering Education and Pedagogy","value":4.07e-05,"subfield":{"id":"https://openalex.org/subfields/3304","display_name":"Education"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":3.22e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":2.6e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7489221096038818},{"id":"149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","score":0.6426858901977539},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4363384544849396},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4289938807487488},{"id":"78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","score":0.20248383283615112}],"counts_by_year":[{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2020,"works_count":5,"oa_works_count":5,"cited_by_count":1},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2024,"works_count":3,"oa_works_count":3,"cited_by_count":0},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":1}],"display_name_alternatives":["MADDUMAGE KARUNARATNE","Maddumage Karunaratne","Maddumage Karunaratne1 And Bejoy G. Oomman2"],"block_key":"m karunaratne","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111928550","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}
