{"id":"https://openalex.org/A5111926808","orcid":null,"observed_orcids":[],"display_name":"Takahiro Maruyama","raw_author_names":["T Maruyama","T. Maruyama","Takahiro Maruyama"],"full_name":"Takahiro Maruyama","works_count":36,"cited_by_count":148,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5111926808","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I113306721","ror":"https://ror.org/03t78wx29","display_name":"Hiroshima University","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},"years":[2010,2009,1999,1997]},{"institution":{"id":"https://openalex.org/I117197279","ror":"https://ror.org/05nf86y53","display_name":"Japan Atomic Energy Agency","country_code":"JP","type":"government","lineage":["https://openalex.org/I117197279"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I118347220","ror":"https://ror.org/04jndar25","display_name":"NEC (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I1292669757","ror":"https://ror.org/0326v3z14","display_name":"Toshiba (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]},"years":[1995]},{"institution":{"id":"https://openalex.org/I129923673","ror":"https://ror.org/02zme4e72","display_name":"JEOL (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I129923673"]},"years":[1969]},{"institution":{"id":"https://openalex.org/I180941496","ror":"https://ror.org/0151bmh98","display_name":"University of Hyogo","country_code":"JP","type":"education","lineage":["https://openalex.org/I180941496"]},"years":[2015,2014]},{"institution":{"id":"https://openalex.org/I2252096349","ror":"https://ror.org/038e2g226","display_name":"Fujitsu (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2252096349"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I4210094230","ror":"https://ror.org/00kf4vm79","display_name":"National Institute of Technology, Ichinoseki College","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210094230","https://openalex.org/I4210120810"]},"years":[2012]},{"institution":{"id":"https://openalex.org/I4210125986","ror":"https://ror.org/03bvwa633","display_name":"Ibaraki National College of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I4210125986"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I4210151476","ror":"https://ror.org/05xrbcc66","display_name":"Advanced Science Research Center","country_code":"JP","type":"facility","lineage":["https://openalex.org/I117197279","https://openalex.org/I4210151476"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I4210153176","ror":"https://ror.org/058wb7691","display_name":"Renesas Electronics (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]},"years":[2020,2017,2016,2006]},{"institution":{"id":"https://openalex.org/I60134161","ror":"https://ror.org/04chrp450","display_name":"Nagoya University","country_code":"JP","type":"education","lineage":["https://openalex.org/I60134161"]},"years":[1987]}],"last_known_institutions":[{"id":"https://openalex.org/I4210153176","ror":"https://ror.org/058wb7691","display_name":"Renesas Electronics (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210153176"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":6.54e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":3.96e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":3.34e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":2.69e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":2.37e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.9219143390655518},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8745759129524231},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6668309569358826},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4421499967575073},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.11417654156684875}],"counts_by_year":[{"year":1969,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":4,"oa_works_count":0,"cited_by_count":14},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":10},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["T Maruyama","T. Maruyama","Takahiro Maruyama"],"block_key":"t maruyama","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111926808","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}