{"id":"https://openalex.org/A5111912401","orcid":null,"observed_orcids":[],"display_name":"J.-L. Everaert","raw_author_names":["Everaert, Jacques","J L Everaert","J-L. Everaert","J. -L. EVERAERT","J. Everaert","J. L. Everaert","J.-L. EVERAERT","J.-L. Everaert","J.L. Everaert","JL. Everaert"],"full_name":"Everaert, Jacques","works_count":47,"cited_by_count":420,"summary_stats":{"2yr_mean_citedness":1.5,"h_index":12,"i10_index":15},"ids":{"openalex":"https://openalex.org/A5111912401","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I193427800","ror":"https://ror.org/04h1q4c89","display_name":"Applied Materials (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I193427800"]},"years":[2008]},{"institution":{"id":"https://openalex.org/I32597200","ror":"https://ror.org/00cv9y106","display_name":"Ghent University","country_code":"BE","type":"education","lineage":["https://openalex.org/I32597200"]},"years":[1995,1990]},{"institution":{"id":"https://openalex.org/I4210114974","ror":"https://ror.org/02kcbn207","display_name":"IMEC","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},"years":[2026,2024,2022,2017,2016,2015,2014,2011,2010,2009,2008,2007,2006,2005,2004,2003]},{"institution":{"id":"https://openalex.org/I99464096","ror":"https://ror.org/05f950310","display_name":"KU Leuven","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},"years":[2008,2007]}],"last_known_institutions":[{"id":"https://openalex.org/I4210114974","ror":"https://ror.org/02kcbn207","display_name":"IMEC","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":43,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":27,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":25,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":10,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":9.88e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":9.27e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":8.91e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":8.72e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":7.08e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8975815773010254},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6491860151290894},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4241468906402588},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3755834400653839},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2683141529560089}],"counts_by_year":[{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":6,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":19},{"year":2015,"works_count":2,"oa_works_count":1,"cited_by_count":7},{"year":2016,"works_count":2,"oa_works_count":0,"cited_by_count":29},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":24},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":32},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":36},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":21},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":13},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":17}],"display_name_alternatives":["Everaert, Jacques","J L Everaert","J-L. Everaert","J. -L. EVERAERT","J. Everaert","J. L. Everaert","J.-L. EVERAERT","J.-L. Everaert","J.L. Everaert","JL. Everaert"],"block_key":"j everaert","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111912401","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}