{"id":"https://openalex.org/A5111867544","orcid":null,"observed_orcids":[],"display_name":"S. Rawal","raw_author_names":["S Rawal","S. Rawal"],"full_name":"S. Rawal","works_count":14,"cited_by_count":450,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5111867544","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]},"years":[2008,2007,2006,2005,2004]},{"institution":{"id":"https://openalex.org/I4210117616","ror":"https://ror.org/028chtg69","display_name":"SVT Associates (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210117616"]},"years":[2006]}],"last_known_institutions":[{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":9,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":7,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","count":5,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","count":2,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":6.91e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","value":3.6e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":2.36e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","value":2.3e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":1.82e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.829694926738739},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.37051165103912354},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.28815481066703796},{"id":"2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","score":0.21013325452804565},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.18644848465919495}],"counts_by_year":[{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":25},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["S Rawal","S. Rawal"],"block_key":"s rawal","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111867544","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111867544","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}