{"id":"https://openalex.org/A5111858112","orcid":null,"observed_orcids":[],"display_name":"Gerald McGunnigle","raw_author_names":["G McGunnigle","G. McGunnigle","Gerald McGunnigle"],"full_name":"Gerald McGunnigle","works_count":39,"cited_by_count":318,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":10,"i10_index":10},"ids":{"openalex":"https://openalex.org/A5111858112","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I32062511","ror":"https://ror.org/04mghma93","display_name":"Heriot-Watt University","country_code":"GB","type":"education","lineage":["https://openalex.org/I32062511"]},"years":[2005,2003,2002,2001,2000,1999]},{"institution":{"id":"https://openalex.org/I4210105127","ror":"https://ror.org/016nn6y69","display_name":"Carinthian Tech Research","country_code":"AT","type":"facility","lineage":["https://openalex.org/I4210105127"]},"years":[2014,2013,2012,2011,2010,2009]},{"institution":{"id":"https://openalex.org/I59028903","ror":"https://ror.org/04rdtx186","display_name":"Ocean University of China","country_code":"CN","type":"education","lineage":["https://openalex.org/I59028903"]},"years":[2011]}],"last_known_institutions":[{"id":"https://openalex.org/I4210105127","ror":"https://ror.org/016nn6y69","display_name":"Carinthian Tech Research","country_code":"AT","type":"facility","lineage":["https://openalex.org/I4210105127"]}],"topics":[{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","count":19,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":15,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":13,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","count":8,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":0.0001081,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":6.79e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10481","display_name":"Computer Graphics and Visualization Techniques","value":4.56e-05,"subfield":{"id":"https://openalex.org/subfields/1704","display_name":"Computer Graphics and Computer-Aided Design"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","value":3.64e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13192","display_name":"Forensic Fingerprint Detection Methods","value":3.32e-05,"subfield":{"id":"https://openalex.org/subfields/3311","display_name":"Safety Research"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"x_concepts":[{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7844998836517334},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7197096347808838},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7035142183303833},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.6370828151702881},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.327539324760437}],"counts_by_year":[{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":5,"oa_works_count":1,"cited_by_count":17},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":14},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":14},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":13},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["G McGunnigle","G. McGunnigle","Gerald McGunnigle"],"block_key":"g mcgunnigle","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111858112","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}