{"id":"https://openalex.org/A5111844165","orcid":null,"observed_orcids":[],"display_name":"Oscar E. Hemberg","raw_author_names":["O Hemberg","O. Hemberg","Oscar E. Hemberg","Oscar Hemberg"],"full_name":"Oscar E. Hemberg","works_count":48,"cited_by_count":677,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":12,"i10_index":16},"ids":{"openalex":"https://openalex.org/A5111844165","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210102905","ror":"https://ror.org/018pb7a22","display_name":"Excillum (Sweden)","country_code":"SE","type":"company","lineage":["https://openalex.org/I4210102905"]},"years":[2019,2018,2017,2016,2015,2014,2012,2009,2008]},{"institution":{"id":"https://openalex.org/I4210135511","ror":"https://ror.org/044kkfr75","display_name":"AlbaNova","country_code":"SE","type":"facility","lineage":["https://openalex.org/I4210135511"]},"years":[2009,2005,2004,2003]},{"institution":{"id":"https://openalex.org/I86987016","ror":"https://ror.org/026vcq606","display_name":"KTH Royal Institute of Technology","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]},"years":[2009,2005,2004,2003,2002,2001,2000]},{"institution":{"id":"https://openalex.org/I92446798","ror":"https://ror.org/03k1gpj17","display_name":"Colorado State University","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]},"years":[2006]}],"last_known_institutions":[{"id":"https://openalex.org/I4210102905","ror":"https://ror.org/018pb7a22","display_name":"Excillum (Sweden)","country_code":"SE","type":"company","lineage":["https://openalex.org/I4210102905"]}],"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":35,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10384","display_name":"Laser-Plasma Interactions and Diagnostics","count":13,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","count":10,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":0.0002639,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.26e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10384","display_name":"Laser-Plasma Interactions and Diagnostics","value":7.92e-05,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12776","display_name":"Electrohydrodynamics and Fluid Dynamics","value":4.43e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","value":4.12e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9035947322845459},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8474637269973755},{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.7469865083694458},{"id":"119947313","wikidata":"https://www.wikidata.org/wiki/Q5596635","display_name":"Jet (fluid)","score":0.7289423942565918},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5450068712234497}],"counts_by_year":[{"year":2000,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":8,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":27},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2014,"works_count":3,"oa_works_count":1,"cited_by_count":28},{"year":2015,"works_count":2,"oa_works_count":1,"cited_by_count":26},{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":36},{"year":2017,"works_count":2,"oa_works_count":1,"cited_by_count":23},{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":27},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":38},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":43},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":18}],"display_name_alternatives":["O Hemberg","O. Hemberg","Oscar E. Hemberg","Oscar Hemberg"],"block_key":"o hemberg","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111844165","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}