{"id":"https://openalex.org/A5111820749","orcid":null,"observed_orcids":[],"display_name":"He Duan","raw_author_names":["H Duan","H. DUAN","H. Duan","HE DUAN","He Duan"],"full_name":"Huiru Duan","works_count":53,"cited_by_count":1803,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":20,"i10_index":28},"ids":{"openalex":"https://openalex.org/A5111820749","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I139024713","ror":"https://ror.org/04azbjn80","display_name":"Guangdong University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]},"years":[2022,2021,2020,2019,2018,2017,2016,2015,2014,2013,2012,2011,2010,2009]},{"institution":{"id":"https://openalex.org/I19820366","ror":"https://ror.org/034t30j35","display_name":"Chinese Academy of Sciences","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},"years":[2011,2010,2007,2006,2005]},{"institution":{"id":"https://openalex.org/I4210135723","ror":"https://ror.org/02txedb84","display_name":"Shanghai Institute of Technical Physics","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210135723"]},"years":[2011,2010,2007,2006,2005]},{"institution":{"id":"https://openalex.org/I96908189","ror":"https://ror.org/059gw8r13","display_name":"Xinjiang University","country_code":"CN","type":"education","lineage":["https://openalex.org/I96908189"]},"years":[2005,2004]}],"last_known_institutions":[{"id":"https://openalex.org/I139024713","ror":"https://ror.org/04azbjn80","display_name":"Guangdong University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"topics":[{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10097","display_name":"Luminescence Properties of Advanced Materials","count":15,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Battery Modeling and Management","count":15,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","count":15,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":0.0001055,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":6.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Battery Modeling and Management","value":5.51e-05,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10097","display_name":"Luminescence Properties of Advanced Materials","value":5.23e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10281","display_name":"Advanced Battery Materials and Technologies","value":4.96e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.8675389289855957},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.853887140750885},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7105908393859863},{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.7067657113075256},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6889145374298096}],"counts_by_year":[{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":27},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":33},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":33},{"year":2015,"works_count":5,"oa_works_count":0,"cited_by_count":32},{"year":2016,"works_count":5,"oa_works_count":2,"cited_by_count":75},{"year":2017,"works_count":3,"oa_works_count":0,"cited_by_count":104},{"year":2018,"works_count":5,"oa_works_count":1,"cited_by_count":167},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":148},{"year":2020,"works_count":2,"oa_works_count":0,"cited_by_count":124},{"year":2021,"works_count":3,"oa_works_count":0,"cited_by_count":141},{"year":2022,"works_count":2,"oa_works_count":0,"cited_by_count":141},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":419},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":126},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":77}],"display_name_alternatives":["H Duan","H. DUAN","H. Duan","HE DUAN","He Duan"],"block_key":"h duan","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111820749","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111820749","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}