{"id":"https://openalex.org/A5111778945","orcid":null,"observed_orcids":[],"display_name":"Derek K. Skinner","raw_author_names":["D K Skinner","D. K. Skinner","D.K. Skinner","Derek K. Skinner"],"full_name":"Derek K. Skinner","works_count":16,"cited_by_count":315,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":9,"i10_index":9},"ids":{"openalex":"https://openalex.org/A5111778945","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I153648349","ror":"https://ror.org/04h699437","display_name":"University of Leicester","country_code":"GB","type":"education","lineage":["https://openalex.org/I153648349"]},"years":[1977]},{"institution":{"id":"https://openalex.org/I4388891765","ror":"https://ror.org/03y8ggs73","display_name":"Marconi Electronic Systems (United Kingdom)","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210143731","https://openalex.org/I4388891765"]},"years":[1995,1991]},{"institution":{"id":"https://openalex.org/I4388891827","ror":"https://ror.org/017kjzz63","display_name":"GEC (United Kingdom)","country_code":"GB","type":"company","lineage":["https://openalex.org/I1306339040","https://openalex.org/I4388891827"]},"years":[1998,1997]},{"institution":{"id":"https://openalex.org/I44377176","ror":"https://ror.org/03h3jqn23","display_name":"European Space Research and Technology Centre","country_code":"NL","type":"government","lineage":["https://openalex.org/I2801994115","https://openalex.org/I44377176"]},"years":[1973,1972]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":12,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":10,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":8,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":6.52e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":4.82e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":3.58e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":1.62e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":1.42e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"2780646311","wikidata":"https://www.wikidata.org/wiki/Q1142501","display_name":"Auger","score":0.9068323969841003},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9034291505813599},{"id":"184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","score":0.6772072315216064},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6685580611228943},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.5655649304389954}],"counts_by_year":[{"year":1969,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1972,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1980,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["D K Skinner","D. K. Skinner","D.K. Skinner","Derek K. Skinner"],"block_key":"d skinner","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111778945","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}