{"id":"https://openalex.org/A5111751653","orcid":null,"observed_orcids":[],"display_name":"Nelson Tam","raw_author_names":["Nelson N. Tam","Nelson Tam"],"full_name":"Nelson N. Tam","works_count":14,"cited_by_count":432,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5111751653","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1343180700","ror":"https://ror.org/01ek73717","display_name":"Intel (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},"years":[1994,1993]},{"institution":{"id":"https://openalex.org/I2803209242","ror":"https://ror.org/00pjdza24","display_name":"University of California System","country_code":"US","type":"education","lineage":["https://openalex.org/I2803209242"]},"years":[1988]},{"institution":{"id":"https://openalex.org/I4210110652","ror":"https://ror.org/01sjwvz98","display_name":"RIKEN","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210110652"]},"years":[2014]},{"institution":{"id":"https://openalex.org/I4210154351","ror":"https://ror.org/04wmff902","display_name":"Marvell (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351"]},"years":[2016,2012,2011,2010]},{"institution":{"id":"https://openalex.org/I64003239","ror":"https://ror.org/01484hw40","display_name":"Marvell (Israel)","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351","https://openalex.org/I64003239"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I95457486","ror":"https://ror.org/01an7q238","display_name":"University of California, Berkeley","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]},"years":[1991,1989,1988]}],"last_known_institutions":[{"id":"https://openalex.org/I4210154351","ror":"https://ror.org/04wmff902","display_name":"Marvell (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210092679","https://openalex.org/I4210154351"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":7,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11176","display_name":"Radiation Therapy and Dosimetry","count":5,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":6.92e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":5.55e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.25e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12224","display_name":"Nanofabrication and Lithography Techniques","value":3.19e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11176","display_name":"Radiation Therapy and Dosimetry","value":1.85e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7300341129302979},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5538373589515686},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.43457329273223877},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.4331362247467041},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.0}],"counts_by_year":[{"year":1988,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":10},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":28},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":43},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":35},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":38},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":25},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":27},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":11}],"display_name_alternatives":["Nelson N. Tam","Nelson Tam"],"block_key":"n tam","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111751653","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}
