{"id":"https://openalex.org/A5111710706","orcid":null,"observed_orcids":[],"display_name":"Marisol S. Mart iacute n-Gonz aacute lez","raw_author_names":["Marisol S. Mart iacute n-Gonz aacute lez","Marisol S. Martín-González"],"full_name":"Marisol S. Mart iacute n-Gonz aacute lez","works_count":1,"cited_by_count":3,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":1,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5111710706","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I134820265","ror":"https://ror.org/02gfc7t72","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},"years":[2012]},{"institution":{"id":"https://openalex.org/I4210147934","ror":"https://ror.org/03ycqrz18","display_name":"Centro Nacional de Microelectr\u00f3nica","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]},"years":[2012]}],"last_known_institutions":[{"id":"https://openalex.org/I134820265","ror":"https://ror.org/02gfc7t72","display_name":"Consejo Superior de Investigaciones Cient\u00edficas","country_code":"ES","type":"government","lineage":["https://openalex.org/I134820265"]},{"id":"https://openalex.org/I4210147934","ror":"https://ror.org/03ycqrz18","display_name":"Centro Nacional de Microelectr\u00f3nica","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"topics":[{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","count":1,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","value":7.9e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":7e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","value":6.9e-06,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"112625512","wikidata":"https://www.wikidata.org/wiki/Q1091448","display_name":"Seebeck coefficient","score":0.6999977231025696},{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.6072874665260315},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.14522305130958557},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.08670610189437866},{"id":"111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","score":0.0}],"counts_by_year":[{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Marisol S. Mart iacute n-Gonz aacute lez","Marisol S. Martín-González"],"block_key":"m aacute lez","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111710706","awards_count":0,"updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}