{"id":"https://openalex.org/A5111707679","orcid":null,"observed_orcids":[],"display_name":"Sami K. Hahto","raw_author_names":["S. Hahto","S. K. Hahto","S.K. Hahto","Sami Hahto","Sami K. Hahto"],"full_name":"Sami K. Hahto","works_count":43,"cited_by_count":227,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":8,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5111707679","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1343871089","ror":"https://ror.org/01e41cf67","display_name":"Los Alamos National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]},"years":[2007]},{"institution":{"id":"https://openalex.org/I139351228","ror":"https://ror.org/031478740","display_name":"Office of Scientific and Technical Information","country_code":"US","type":"government","lineage":["https://openalex.org/I1330989302","https://openalex.org/I139351228","https://openalex.org/I39565521"]},"years":[2003]},{"institution":{"id":"https://openalex.org/I148283060","ror":"https://ror.org/02jbv0t02","display_name":"Lawrence Berkeley National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I148283060","https://openalex.org/I39565521"]},"years":[2008,2007,2006,2005,2004,2003,2002]},{"institution":{"id":"https://openalex.org/I4405273606","ror":"https://ror.org/004fszq46","display_name":"Nissin Ion Equipment Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405273606"]},"years":[2025,2023,2016,2008]},{"institution":{"id":"https://openalex.org/I94722563","ror":"https://ror.org/05n3dz165","display_name":"University of Jyv\u00e4skyl\u00e4","country_code":"FI","type":"education","lineage":["https://openalex.org/I94722563"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I95457486","ror":"https://ror.org/01an7q238","display_name":"University of California, Berkeley","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]},"years":[2005,2004]}],"last_known_institutions":[{"id":"https://openalex.org/I4405273606","ror":"https://ror.org/004fszq46","display_name":"Nissin Ion Equipment Co., Ltd. (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405273606"]}],"topics":[{"id":"https://openalex.org/T11367","display_name":"Particle accelerators and beam dynamics","count":39,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":22,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Low-Pressure Plasma Processing and Diagnostics","count":20,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","count":20,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":2.77e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11175","display_name":"Gyrotron and Vacuum Electronics Research","value":2.54e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","value":2.41e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11920","display_name":"Pulsed Power Technology Applications","value":2.31e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11949","display_name":"Nuclear Physics and Applications","value":1.6e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9119194746017456},{"id":"145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","score":0.7980028390884399},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7958569526672363},{"id":"185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","score":0.5453490614891052},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.07935601472854614}],"counts_by_year":[{"year":2002,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":4,"cited_by_count":0},{"year":2004,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":2005,"works_count":8,"oa_works_count":3,"cited_by_count":0},{"year":2006,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2007,"works_count":4,"oa_works_count":2,"cited_by_count":0},{"year":2008,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2016,"works_count":2,"oa_works_count":0,"cited_by_count":9},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":5,"oa_works_count":0,"cited_by_count":21},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":14}],"display_name_alternatives":["S. Hahto","S. K. Hahto","S.K. Hahto","Sami Hahto","Sami K. Hahto"],"block_key":"s hahto","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111707679","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111707679","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}