{"id":"https://openalex.org/A5111693731","orcid":null,"observed_orcids":[],"display_name":"C. Stephens","raw_author_names":["C Stephens","C. Stephens"],"full_name":"Curtis L. Stephens","works_count":15,"cited_by_count":148,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5111693731","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I114090438","ror":"https://ror.org/04cvxnb49","display_name":"Goethe University Frankfurt","country_code":"DE","type":"education","lineage":["https://openalex.org/I114090438"]},"years":[1990,1989]},{"institution":{"id":"https://openalex.org/I205274468","ror":"https://ror.org/02tyrky19","display_name":"Trinity College Dublin","country_code":"IE","type":"education","lineage":["https://openalex.org/I205274468"]},"years":[2009,2006,1992,1991,1990,1989,1988]},{"institution":{"id":"https://openalex.org/I2800875726","ror":"https://ror.org/03k9qs827","display_name":"Fritz Haber Institute of the Max Planck Society","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I2800875726"]},"years":[1988]},{"institution":{"id":"https://openalex.org/I4577782","ror":"https://ror.org/03v4gjf40","display_name":"Technische Universit\u00e4t Berlin","country_code":"DE","type":"education","lineage":["https://openalex.org/I4577782"]},"years":[1990,1989]},{"institution":{"id":"https://openalex.org/I79510175","ror":"https://ror.org/03kk7td41","display_name":"Cardiff University","country_code":"GB","type":"education","lineage":["https://openalex.org/I79510175"]},"years":[1988]},{"institution":{"id":"https://openalex.org/I97429440","ror":"https://ror.org/01se4f844","display_name":"University of Wales","country_code":"GB","type":"education","lineage":["https://openalex.org/I97429440"]},"years":[1988]}],"last_known_institutions":[{"id":"https://openalex.org/I205274468","ror":"https://ror.org/02tyrky19","display_name":"Trinity College Dublin","country_code":"IE","type":"education","lineage":["https://openalex.org/I205274468"]}],"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":12,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":11,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","count":11,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12285","display_name":"Surface Chemistry and Catalysis","count":3,"subfield":{"id":"https://openalex.org/subfields/1606","display_name":"Physical and Theoretical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","value":4.27e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":3.28e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":3.22e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":2.43e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10913","display_name":"Molecular Junctions and Nanostructures","value":2.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","score":0.7577226161956787},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6568183898925781},{"id":"113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","score":0.5084020495414734},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.48980093002319336},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.15597638487815857}],"counts_by_year":[{"year":1988,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":1990,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["C Stephens","C. Stephens"],"block_key":"c stephens","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111693731","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}