{"id":"https://openalex.org/A5111662301","orcid":null,"observed_orcids":[],"display_name":"Yasumasa Itakura","raw_author_names":["Yasumasa ITAKURA","Yasumasa Itakura","\u5b89\u6b63 \u677f\u5009"],"full_name":"Yasumasa ITAKURA","works_count":25,"cited_by_count":153,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5111662301","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I171494771","ror":"https://ror.org/01vvhy971","display_name":"Shiga University","country_code":"JP","type":"education","lineage":["https://openalex.org/I171494771"]},"years":[2003,2002,2000,1998,1997,1996,1993,1991,1989,1987,1984,1982]},{"institution":{"id":"https://openalex.org/I27429435","ror":"https://ror.org/00965ax52","display_name":"Kyoto Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I27429435"]},"years":[1998,1979]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10535","display_name":"Landslides and related hazards","count":8,"subfield":{"id":"https://openalex.org/subfields/2308","display_name":"Management, Monitoring, Policy and Law"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10360","display_name":"Fluid Dynamics and Turbulent Flows","count":7,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","value":5.96e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":5.55e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":3.81e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10535","display_name":"Landslides and related hazards","value":3.1e-05,"subfield":{"id":"https://openalex.org/subfields/2308","display_name":"Management, Monitoring, Policy and Law"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13018","display_name":"Seismology and Earthquake Studies","value":2.17e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6870827674865723},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6395164132118225},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5330435633659363},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.48830604553222656},{"id":"153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","score":0.3487432599067688}],"counts_by_year":[{"year":1974,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1984,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1987,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Yasumasa ITAKURA","Yasumasa Itakura","\u5b89\u6b63 \u677f\u5009"],"block_key":"y itakura","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111662301","updated_date":"2026-10-31T12:29:50","created_date":"2016-06-24T00:00:00"}