{"id":"https://openalex.org/A5111610897","orcid":null,"observed_orcids":[],"display_name":"J.-M. Halbout","raw_author_names":["Halbout, J. -M.","J-M. Halbout","J. -M. Halbout","J. Halbout","J. M. Halbout","J.-M Halbout","J.-M. HALBOUT","J.-M. Halbout","J.M. Halbout","Jean-Marc Halbout"],"full_name":"Jean-Marc Halbout","works_count":106,"cited_by_count":2271,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":24,"i10_index":36},"ids":{"openalex":"https://openalex.org/A5111610897","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1341412227","ror":"https://ror.org/05hh8d621","display_name":"IBM (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},"years":[1992,1991,1990,1988,1987,1986]},{"institution":{"id":"https://openalex.org/I205783295","ror":"https://ror.org/05bnh6r87","display_name":"Cornell University","country_code":"US","type":"education","lineage":["https://openalex.org/I205783295"]},"years":[1983,1982,1981,1980,1979]},{"institution":{"id":"https://openalex.org/I4210114115","ror":"https://ror.org/0265w5591","display_name":"IBM Research - Thomas J. Watson Research Center","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},"years":[2005,2002,1996,1993,1992,1991,1990,1989,1988,1987,1986,1985,1984]}],"last_known_institutions":[{"id":"https://openalex.org/I4210114115","ror":"https://ror.org/0265w5591","display_name":"IBM Research - Thomas J. Watson Research Center","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","count":30,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10566","display_name":"Laser-Matter Interactions and Applications","count":25,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11050","display_name":"Photorefractive and Nonlinear Optics","count":20,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":19,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0003116,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","value":0.0002512,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0001261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10988","display_name":"Advanced Fiber Laser Technologies","value":9.24e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11025","display_name":"Nonlinear Optical Materials Research","value":8.05e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.91068035364151},{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.8087605237960815},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7799383401870728},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7665963172912598},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5537468194961548}],"counts_by_year":[{"year":1979,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1981,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":8,"oa_works_count":0,"cited_by_count":0},{"year":1983,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":14,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":13,"oa_works_count":1,"cited_by_count":0},{"year":1989,"works_count":14,"oa_works_count":1,"cited_by_count":0},{"year":1990,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":10,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":37},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":43},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":44},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":57},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":15}],"display_name_alternatives":["Halbout, J. -M.","J-M. Halbout","J. -M. Halbout","J. Halbout","J. M. Halbout","J.-M Halbout","J.-M. HALBOUT","J.-M. Halbout","J.M. Halbout","Jean-Marc Halbout"],"block_key":"j halbout","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111610897","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}