{"id":"https://openalex.org/A5111593508","orcid":null,"observed_orcids":[],"display_name":"D.S.H. Chan","raw_author_names":["D S H Chan","D. Chan","D. S. H. Chan","D. Siu-Hung Chan","D.S.H Chan","D.S.H. Chan","D.\u2009S.\u2009H. Chan","DSH Chan"],"full_name":"D. Siu-Hung Chan","works_count":130,"cited_by_count":4765,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":33,"i10_index":61},"ids":{"openalex":"https://openalex.org/A5111593508","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I115228651","ror":"https://ror.org/036wvzt09","display_name":"Agency for Science, Technology and Research","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},"years":[2008]},{"institution":{"id":"https://openalex.org/I144291393","ror":"https://ror.org/03k5xes38","display_name":"Data Storage Institute","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I144291393"]},"years":[1999,1998,1997]},{"institution":{"id":"https://openalex.org/I148366613","ror":"https://ror.org/00se2k293","display_name":"National Yang Ming Chiao Tung University","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I154864474","ror":"https://ror.org/00q09pe49","display_name":"National Taiwan University of Science and Technology","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]},"years":[2009]},{"institution":{"id":"https://openalex.org/I165932596","ror":"https://ror.org/01tgyzw49","display_name":"National University of Singapore","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]},"years":[2011,2009,2008,2007,2006,2005,2004,2003,2002,2001,2000,1999,1998,1997,1996,1995,1994,1993,1988,1987,1986,1984,1983]},{"institution":{"id":"https://openalex.org/I200769079","ror":"https://ror.org/00q4vv597","display_name":"Hong Kong University of Science and Technology","country_code":"HK","type":"education","lineage":["https://openalex.org/I200769079"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I4210090209","ror":"https://ror.org/009rw8n36","display_name":"Institute of Microelectronics","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]},"years":[2008,2006,2004]},{"institution":{"id":"https://openalex.org/I54459138","ror":"https://ror.org/01tmqtf75","display_name":"University of Salford","country_code":"GB","type":"education","lineage":["https://openalex.org/I54459138"]},"years":[1976,1975]},{"institution":{"id":"https://openalex.org/I86519309","ror":"https://ror.org/00hj54h04","display_name":"The University of Texas at Austin","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]},"years":[2004]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":72,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":38,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":37,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":33,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":31,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0004664,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0003375,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0002762,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":0.000149,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":0.000137,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8841486573219299},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7093656659126282},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.632631778717041},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6043996214866638},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.36781030893325806}],"counts_by_year":[{"year":1975,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1984,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1993,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":6,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":8,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":25,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":11,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":8,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":281},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":287},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":264},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":238},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":217},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":217},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":189},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":182},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":204},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":198},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":176},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":130},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":156},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":68}],"display_name_alternatives":["D S H Chan","D. Chan","D. S. H. Chan","D. Siu-Hung Chan","D.S.H Chan","D.S.H. Chan","D.\u2009S.\u2009H. Chan","DSH Chan"],"block_key":"d chan","works_api_url":"https://api.openalex.org/works?filter=author.id:A5111593508","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5111593508","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}